Presentation 2011-07-22
All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya IIZUKA, Kunihiro ASADA,
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Abstract(in English) This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring oscillator. The proposed circuit monitors the PMOS and NMOS process variabilities independently according to a count number of a single pulse which propagates on the ring during the buffer ring mode, and a oscillation frequency during the ring oscillator mode. Using this shared-ring structure, we reduce the occupation area about 40% without loss of process variability monitoring properties compared with the conventional circuit. The proposed shared-ring circuit has been fabricated in 65nm CMOS process and the measurement results with two different wafer lots show the feasibility of the proposed process variability monitoring scheme.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) process variability / on-chip monitor / buffer ring / all digital
Paper # ICD2011-26
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Committee ICD
Conference Date 2011/7/14(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Sub Title (in English)
Keyword(1) process variability
Keyword(2) on-chip monitor
Keyword(3) buffer ring
Keyword(4) all digital
1st Author's Name Tetsuya IIZUKA
1st Author's Affiliation Dept. of Electrical Engineering and Information Systems, University of Tokyo()
2nd Author's Name Kunihiro ASADA
2nd Author's Affiliation Dept. of Electrical Engineering and Information Systems, University of Tokyo
Date 2011-07-22
Paper # ICD2011-26
Volume (vol) vol.111
Number (no) 151
Page pp.pp.-
#Pages 6
Date of Issue