Presentation | 2011-07-13 Security Evaluation of HyRAL against Saturation Cryptanalysis(II) Naoki SHIBAYAMA, Yasutaka IGARASHI, Toshinobu KANEKO, Seiichiro HANGAI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, we focuse on the saturation attack on block cipher HyRAL that was proposed by Hirata in 2010. It has been shown that 12-round with 256-bit secret key is attackable by higher order differential attack using 7-round synchronous higher order differential characteristics. Based on this characteristics, this paper shows a new 9-round saturation characteristics of HyRAL using 64-th order differential, and estimates the costs of the attack using them. For the case of a 256-bit secret key, it is possible to apply the saturation attack to 13-round HyRAL. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | HyRAL / Block Cipher / Saturation Characteristics / Cryptanalysis |
Paper # | ISEC2011-19,SITE2011-16,ICSS2011-24,EMM2011-18 |
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Conference Information | |
Committee | ISEC |
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Conference Date | 2011/7/5(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Information Security (ISEC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Security Evaluation of HyRAL against Saturation Cryptanalysis(II) |
Sub Title (in English) | |
Keyword(1) | HyRAL |
Keyword(2) | Block Cipher |
Keyword(3) | Saturation Characteristics |
Keyword(4) | Cryptanalysis |
1st Author's Name | Naoki SHIBAYAMA |
1st Author's Affiliation | Department of Electrical Engineering, Faculty of Engineering, Tokyo University of Science() |
2nd Author's Name | Yasutaka IGARASHI |
2nd Author's Affiliation | Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science |
3rd Author's Name | Toshinobu KANEKO |
3rd Author's Affiliation | Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science |
4th Author's Name | Seiichiro HANGAI |
4th Author's Affiliation | Department of Electrical Engineering, Faculty of Engineering, Tokyo University of Science |
Date | 2011-07-13 |
Paper # | ISEC2011-19,SITE2011-16,ICSS2011-24,EMM2011-18 |
Volume (vol) | vol.111 |
Number (no) | 123 |
Page | pp.pp.- |
#Pages | 7 |
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