| Presentation | 2011-06-24 Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification K. MIYASE, Y. UCHINODAN, K. ENOKIMOTO, Y. YAMATO, X. WEN, S. KAJIHARA, F. WU, L. DILILLO, A. BOSIO, P. GIRARD, A. VIRAZEL, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we present a test vector modification method to reduce launch-to-capture power for LOS scheme. The proposed method modifies given test vectors to reduce launch-to-capture power without fault coverage loss. Experimental results for ITC'99 benchmark circuits show that the proposed method can effectively reduce launch-to-capture power. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | At-Speed Testing / Low Power Testing / X-Filling / X-Identification / Test Generation |
| Paper # | DC2011-13 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2011/6/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification |
| Sub Title (in English) | |
| Keyword(1) | At-Speed Testing |
| Keyword(2) | Low Power Testing |
| Keyword(3) | X-Filling |
| Keyword(4) | X-Identification |
| Keyword(5) | Test Generation |
| 1st Author's Name | K. MIYASE |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Y. UCHINODAN |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | K. ENOKIMOTO |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Y. YAMATO |
| 4th Author's Affiliation | Nara Institute of Science and Technology |
| 5th Author's Name | X. WEN |
| 5th Author's Affiliation | Kyushu Institute of Technology |
| 6th Author's Name | S. KAJIHARA |
| 6th Author's Affiliation | Kyushu Institute of Technology |
| 7th Author's Name | F. WU |
| 7th Author's Affiliation | LIRMM-University of Montpellier II/CNRS |
| 8th Author's Name | L. DILILLO |
| 8th Author's Affiliation | LIRMM-University of Montpellier II/CNRS |
| 9th Author's Name | A. BOSIO |
| 9th Author's Affiliation | LIRMM-University of Montpellier II/CNRS |
| 10th Author's Name | P. GIRARD |
| 10th Author's Affiliation | LIRMM-University of Montpellier II/CNRS |
| 11th Author's Name | A. VIRAZEL |
| 11th Author's Affiliation | LIRMM-University of Montpellier II/CNRS |
| Date | 2011-06-24 |
| Paper # | DC2011-13 |
| Volume (vol) | vol.111 |
| Number (no) | 100 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |