Presentation 2011-06-24
A don't care identification method with care bit distribution control : Application to capture power reduction
Hiroshi Yamazaki, Toshinori HOSOKAWA, Masayoshi YOSHIMURA,
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Abstract(in English) The growing density and complexity for VLSIs recently cause an increase in the numbers of test patterns and fault models to be tested, and significant capture-induced yield loss by excessive high power dissipation. Test generations for high quality, low cost and low power dissipation are required to solve these problems. One of means to implement such test generations is don't care identification technique. However, in conventional don't care identification techniques, don't care bits tend to concentrate on specific test patterns and/or pseudo primary inputs. Therefore, the techniques may not be effective for application fields such as capture power reduction and thermal-uniformity on scan testing. In this paper, we propose a don't care identification method to control care bit distribution for an initial test pattern set. Experimental results for ITC'99 benchmark circuits show that our proposed method is effective for capture power reduction.
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Keyword(in English) don't care identification / care bit distribution / pseudo primary inputs / capture power reduction / capture-safe
Paper # DC2011-12
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Committee DC
Conference Date 2011/6/17(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A don't care identification method with care bit distribution control : Application to capture power reduction
Sub Title (in English)
Keyword(1) don't care identification
Keyword(2) care bit distribution
Keyword(3) pseudo primary inputs
Keyword(4) capture power reduction
Keyword(5) capture-safe
1st Author's Name Hiroshi Yamazaki
1st Author's Affiliation Graduate School of Industrial Technology, Nihon University()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation College of Industrial Technology, Nihon University
3rd Author's Name Masayoshi YOSHIMURA
3rd Author's Affiliation Faculty of Engineering, Kyushu University
Date 2011-06-24
Paper # DC2011-12
Volume (vol) vol.111
Number (no) 100
Page pp.pp.-
#Pages 6
Date of Issue