| Presentation | 2011-06-24 A don't care identification method with care bit distribution control : Application to capture power reduction Hiroshi Yamazaki, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The growing density and complexity for VLSIs recently cause an increase in the numbers of test patterns and fault models to be tested, and significant capture-induced yield loss by excessive high power dissipation. Test generations for high quality, low cost and low power dissipation are required to solve these problems. One of means to implement such test generations is don't care identification technique. However, in conventional don't care identification techniques, don't care bits tend to concentrate on specific test patterns and/or pseudo primary inputs. Therefore, the techniques may not be effective for application fields such as capture power reduction and thermal-uniformity on scan testing. In this paper, we propose a don't care identification method to control care bit distribution for an initial test pattern set. Experimental results for ITC'99 benchmark circuits show that our proposed method is effective for capture power reduction. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | don't care identification / care bit distribution / pseudo primary inputs / capture power reduction / capture-safe |
| Paper # | DC2011-12 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2011/6/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A don't care identification method with care bit distribution control : Application to capture power reduction |
| Sub Title (in English) | |
| Keyword(1) | don't care identification |
| Keyword(2) | care bit distribution |
| Keyword(3) | pseudo primary inputs |
| Keyword(4) | capture power reduction |
| Keyword(5) | capture-safe |
| 1st Author's Name | Hiroshi Yamazaki |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Faculty of Engineering, Kyushu University |
| Date | 2011-06-24 |
| Paper # | DC2011-12 |
| Volume (vol) | vol.111 |
| Number (no) | 100 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |