| Presentation | 2011-06-24 Effective Multi-cycle Signatures in Testable Response Analyzers Yuki FUKAZAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In the BIST (built-in self-test) scheme, we have proposed a concurrent testable response analyzer, called an encoding-based response analyzer [8]. In this paper, we discuss effect of introducing multi-cycle signature observation, in which signatures are observed several times at different cycles, to the encoding-based response analyzer. Multi-cycle signature observation can enhance self-distinguishability to show the concurrent testability. Furthermore, we clarify the relationship among self-distinguishability, redundancy of employed cyclic codes and the number of signature observation. This relationship can give us the area size of response analyzer and the number of signature observation required to achieve sufficient self-distinguishability. Experimental results for benchmark circuits show that the obtained area size and signature observation times are meaningful and the introduction of multi-cycle signatures observation can increase the flexibility of designing concurrent testable reponse analyzers under area and self-distinguishability constraints. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Built-in self-test / MISR compactor / coding / concurrent test / multi-cycle signature |
| Paper # | DC2011-9 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2011/6/17(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Effective Multi-cycle Signatures in Testable Response Analyzers |
| Sub Title (in English) | |
| Keyword(1) | Built-in self-test |
| Keyword(2) | MISR compactor |
| Keyword(3) | coding |
| Keyword(4) | concurrent test |
| Keyword(5) | multi-cycle signature |
| 1st Author's Name | Yuki FUKAZAWA |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Hideyuki ICHIHARA |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Tomoo INOUE |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2011-06-24 |
| Paper # | DC2011-9 |
| Volume (vol) | vol.111 |
| Number (no) | 100 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |