Presentation 2011-06-24
An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults
Satoshi FUKUMOTO, Masayuki ARAI, Shinya HARA, Kazuhiko IWASAKI,
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Abstract(in English) In this paper, we analyze the distribution of fault coverage in random-pattern testing. We introduce a stochastic variable that maps the events of detection and non-detection of each fault in a random-pattern testing into the integers 1 and 0 respectively. Based on this variable, we establish a stochastic evaluation model and numerically show that mean and variance of fault coverage distribution can be estimated precisely from the analytical results.
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Keyword(in English) fault coverage / ramdom-pattern testing / stochastic model
Paper # DC2011-8
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Committee DC
Conference Date 2011/6/17(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults
Sub Title (in English)
Keyword(1) fault coverage
Keyword(2) ramdom-pattern testing
Keyword(3) stochastic model
1st Author's Name Satoshi FUKUMOTO
1st Author's Affiliation Faculty of System Design, Tokyo Metropolitan University()
2nd Author's Name Masayuki ARAI
2nd Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
3rd Author's Name Shinya HARA
3rd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
4th Author's Name Kazuhiko IWASAKI
4th Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
Date 2011-06-24
Paper # DC2011-8
Volume (vol) vol.111
Number (no) 100
Page pp.pp.-
#Pages 4
Date of Issue