Presentation | 2011-06-24 An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults Satoshi FUKUMOTO, Masayuki ARAI, Shinya HARA, Kazuhiko IWASAKI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, we analyze the distribution of fault coverage in random-pattern testing. We introduce a stochastic variable that maps the events of detection and non-detection of each fault in a random-pattern testing into the integers 1 and 0 respectively. Based on this variable, we establish a stochastic evaluation model and numerically show that mean and variance of fault coverage distribution can be estimated precisely from the analytical results. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | fault coverage / ramdom-pattern testing / stochastic model |
Paper # | DC2011-8 |
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Committee | DC |
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Conference Date | 2011/6/17(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults |
Sub Title (in English) | |
Keyword(1) | fault coverage |
Keyword(2) | ramdom-pattern testing |
Keyword(3) | stochastic model |
1st Author's Name | Satoshi FUKUMOTO |
1st Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University() |
2nd Author's Name | Masayuki ARAI |
2nd Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University |
3rd Author's Name | Shinya HARA |
3rd Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University |
4th Author's Name | Kazuhiko IWASAKI |
4th Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University |
Date | 2011-06-24 |
Paper # | DC2011-8 |
Volume (vol) | vol.111 |
Number (no) | 100 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |