Presentation 2011-06-30
Electrical Property Improvement by Inserting a Buffer Layer in Impurity-Doped ZnO Transparent Electrodes Prepared by Magnetron Sputtering Depositions
Jun-ichi NOMOTO, Tomoyasu HIRANO, Toshihiro MIYATA, Tadatsugu MINAMI,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Improvements of obtainable lowest resistivity as well as spatial resistivity distribution on the substrate surface in Al- or Ga-doped ZnO (AZO or GZO) thin films prepared by a newly developed deposition technique using an MS apparatus were successfully achieved by inserting a very thin buffer layer between the thin films and the glass substrates. The buffer layer was deposited by sputtering a target surface that was more strongly oxidized than is usually the case during conventional d.c. or r.f. superimposed d.c. magnetron sputtering (dc-MS or rf+dc-MS) depositions optimized to obtain lower resistivity. A minimum resistivity of approximately 3×10^<-4>Ωcm was obtained in 150-nm-thick-GZO and -AZO thin films that had a 10-nm-thick-buffer layer prepared at 200℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ZnO / AZO / GZO / Magnetron sputtering / Buffer layer
Paper # EMD2011-11,CPM2011-47,OME2011-25
Date of Issue

Conference Information
Committee EMD
Conference Date 2011/6/23(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electrical Property Improvement by Inserting a Buffer Layer in Impurity-Doped ZnO Transparent Electrodes Prepared by Magnetron Sputtering Depositions
Sub Title (in English)
Keyword(1) ZnO
Keyword(2) AZO
Keyword(3) GZO
Keyword(4) Magnetron sputtering
Keyword(5) Buffer layer
1st Author's Name Jun-ichi NOMOTO
1st Author's Affiliation O.E.Device System R&D Center, Kanazawa I.T.()
2nd Author's Name Tomoyasu HIRANO
2nd Author's Affiliation O.E.Device System R&D Center, Kanazawa I.T.
3rd Author's Name Toshihiro MIYATA
3rd Author's Affiliation O.E.Device System R&D Center, Kanazawa I.T.
4th Author's Name Tadatsugu MINAMI
4th Author's Affiliation O.E.Device System R&D Center, Kanazawa I.T.
Date 2011-06-30
Paper # EMD2011-11,CPM2011-47,OME2011-25
Volume (vol) vol.111
Number (no) 108
Page pp.pp.-
#Pages 5
Date of Issue