| Presentation | 2011-06-23 In-service identification of signal quality by using wavelength resolved stokes vector analysis Hitoshi TAKESHITA, Arihide NODA, Yoshihiro KANDA, Masatoshi KAGAWA, Hitoshi MURAI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | It is important to identify a cause of signal degradation immediately for retrieval of telecommunication network fault. Transmission signal quality of optical fiber network is dependent to optical impairments such as chromatic and polarization mode dispersion, non-linear effects and accumulation of amplified spontaneous emission. Therefore, in-service monitoring of those optical impairments distinctly is essential. In this paper, we propose a method to identify a cause of signal degradation by using wavelength resolved stokes vector analysis. And, we report about a monitor prototype and verification of potential of our method by transmission and network control experiments. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | optical performance monitor / PMD / stokes vector / state of polarization / Poincare sphere |
| Paper # | OCS2011-11 |
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| Conference Information | |
| Committee | OCS |
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| Conference Date | 2011/6/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Optical Communication Systems (OCS) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | In-service identification of signal quality by using wavelength resolved stokes vector analysis |
| Sub Title (in English) | |
| Keyword(1) | optical performance monitor |
| Keyword(2) | PMD |
| Keyword(3) | stokes vector |
| Keyword(4) | state of polarization |
| Keyword(5) | Poincare sphere |
| 1st Author's Name | Hitoshi TAKESHITA |
| 1st Author's Affiliation | System Platforms Research Labs, NEC() |
| 2nd Author's Name | Arihide NODA |
| 2nd Author's Affiliation | System Platforms Research Labs, NEC |
| 3rd Author's Name | Yoshihiro KANDA |
| 3rd Author's Affiliation | Corporate R&D Center, Oki Electric Industry Co., Ltd. |
| 4th Author's Name | Masatoshi KAGAWA |
| 4th Author's Affiliation | Corporate R&D Center, Oki Electric Industry Co., Ltd. |
| 5th Author's Name | Hitoshi MURAI |
| 5th Author's Affiliation | Corporate R&D Center, Oki Electric Industry Co., Ltd. |
| Date | 2011-06-23 |
| Paper # | OCS2011-11 |
| Volume (vol) | vol.111 |
| Number (no) | 92 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |