Presentation | 2011-05-26 Measurement of Electromagnetic Field Intensity Measurement near Circuit Board using Infrared 2-D Lock-in Amplifier Noritaka CHIYO, Yuji KOMINE, Yasuhiro TANAKA, Atsuhiro NISHIKATA, Takuichi HIRANO, Takeshi MAENO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have developed an electromagnetic field intensity distribution measurement system using electromagnetic absorption screen. In this system, a very small temperature change on a screen illuminated with an electromagnetic wave is measured using an infrared thermograph camera. It is expected that this system is very useful for the evaluation of the electromagnetic noise emitted from electric devices. In this paper, we describe measurement results of the electric/magnetic field near a dipole antenna. Furthermore, we tired to measure the electric field near circuit boards. We could have a clear image of the electromagnetic field by using this system. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Dipole antenna / Micro strip line / Balance filter / Electromagnetic noise / Electromagnetic field near circuit board / 2-D lock-in amplifier / Visualization / Measurement |
Paper # | EMCJ2011-11,MW2011-8,EST2011-4 |
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Conference Information | |
Committee | EST |
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Conference Date | 2011/5/19(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electronic Simulation Technology (EST) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Measurement of Electromagnetic Field Intensity Measurement near Circuit Board using Infrared 2-D Lock-in Amplifier |
Sub Title (in English) | |
Keyword(1) | Dipole antenna |
Keyword(2) | Micro strip line |
Keyword(3) | Balance filter |
Keyword(4) | Electromagnetic noise |
Keyword(5) | Electromagnetic field near circuit board |
Keyword(6) | 2-D lock-in amplifier |
Keyword(7) | Visualization |
Keyword(8) | Measurement |
1st Author's Name | Noritaka CHIYO |
1st Author's Affiliation | Tokyo City University() |
2nd Author's Name | Yuji KOMINE |
2nd Author's Affiliation | Tokyo City University |
3rd Author's Name | Yasuhiro TANAKA |
3rd Author's Affiliation | Tokyo City University |
4th Author's Name | Atsuhiro NISHIKATA |
4th Author's Affiliation | Tokyo Institute of Technology |
5th Author's Name | Takuichi HIRANO |
5th Author's Affiliation | Tokyo Institute of Technology |
6th Author's Name | Takeshi MAENO |
6th Author's Affiliation | National Institute of Information and Communications Technology:Tokyo City University |
Date | 2011-05-26 |
Paper # | EMCJ2011-11,MW2011-8,EST2011-4 |
Volume (vol) | vol.111 |
Number (no) | 66 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |