Presentation 2011-05-26
Measurement of Electromagnetic Field Intensity Measurement near Circuit Board using Infrared 2-D Lock-in Amplifier
Noritaka CHIYO, Yuji KOMINE, Yasuhiro TANAKA, Atsuhiro NISHIKATA, Takuichi HIRANO, Takeshi MAENO,
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Abstract(in English) We have developed an electromagnetic field intensity distribution measurement system using electromagnetic absorption screen. In this system, a very small temperature change on a screen illuminated with an electromagnetic wave is measured using an infrared thermograph camera. It is expected that this system is very useful for the evaluation of the electromagnetic noise emitted from electric devices. In this paper, we describe measurement results of the electric/magnetic field near a dipole antenna. Furthermore, we tired to measure the electric field near circuit boards. We could have a clear image of the electromagnetic field by using this system.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Dipole antenna / Micro strip line / Balance filter / Electromagnetic noise / Electromagnetic field near circuit board / 2-D lock-in amplifier / Visualization / Measurement
Paper # EMCJ2011-11,MW2011-8,EST2011-4
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Committee EST
Conference Date 2011/5/19(1days)
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Registration To Electronic Simulation Technology (EST)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of Electromagnetic Field Intensity Measurement near Circuit Board using Infrared 2-D Lock-in Amplifier
Sub Title (in English)
Keyword(1) Dipole antenna
Keyword(2) Micro strip line
Keyword(3) Balance filter
Keyword(4) Electromagnetic noise
Keyword(5) Electromagnetic field near circuit board
Keyword(6) 2-D lock-in amplifier
Keyword(7) Visualization
Keyword(8) Measurement
1st Author's Name Noritaka CHIYO
1st Author's Affiliation Tokyo City University()
2nd Author's Name Yuji KOMINE
2nd Author's Affiliation Tokyo City University
3rd Author's Name Yasuhiro TANAKA
3rd Author's Affiliation Tokyo City University
4th Author's Name Atsuhiro NISHIKATA
4th Author's Affiliation Tokyo Institute of Technology
5th Author's Name Takuichi HIRANO
5th Author's Affiliation Tokyo Institute of Technology
6th Author's Name Takeshi MAENO
6th Author's Affiliation National Institute of Information and Communications Technology:Tokyo City University
Date 2011-05-26
Paper # EMCJ2011-11,MW2011-8,EST2011-4
Volume (vol) vol.111
Number (no) 66
Page pp.pp.-
#Pages 6
Date of Issue