| Presentation | 2011-05-20 Aging test of AlGaN-based ultraviolet light emitting diodes : The Degradation Mechanism of UV-LED Gwi Jin PARK, Takayuki SUGIYAMA, Tomoyuki TANIKAWA, Yoshio HONDA, Masahito YAMAGUCHI, Hiroshi AMANO, Tetsuhiko INAZU, Takehiko FUJITA, Cyril PERNOT, Akira HIRANO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have investigated the relationship between leak current and light efficiency from change in the current-voltage and current-light characteristics of ultraviolet light emitting diodes. With aging time, current-voltage characteristic indicates increase of leak current. The internal quantum efficiency decreased after 400 hours aging time. The possible degradation mechanism of quantum-wells is the thermal stress from leak current which do not effect to light emission of UV-LED. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | AlGaN / UV-LED / Aging Test / Leak Current |
| Paper # | ED2011-24,CPM2011-31,SDM2011-37 |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 2011/5/12(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Aging test of AlGaN-based ultraviolet light emitting diodes : The Degradation Mechanism of UV-LED |
| Sub Title (in English) | |
| Keyword(1) | AlGaN |
| Keyword(2) | UV-LED |
| Keyword(3) | Aging Test |
| Keyword(4) | Leak Current |
| 1st Author's Name | Gwi Jin PARK |
| 1st Author's Affiliation | Graduate School of Engineering, ARC, Nagoya University() |
| 2nd Author's Name | Takayuki SUGIYAMA |
| 2nd Author's Affiliation | Graduate School of Engineering, ARC, Nagoya University |
| 3rd Author's Name | Tomoyuki TANIKAWA |
| 3rd Author's Affiliation | Graduate School of Engineering, ARC, Nagoya University |
| 4th Author's Name | Yoshio HONDA |
| 4th Author's Affiliation | Graduate School of Engineering, ARC, Nagoya University |
| 5th Author's Name | Masahito YAMAGUCHI |
| 5th Author's Affiliation | Graduate School of Engineering, ARC, Nagoya University |
| 6th Author's Name | Hiroshi AMANO |
| 6th Author's Affiliation | Graduate School of Engineering, ARC, Nagoya University |
| 7th Author's Name | Tetsuhiko INAZU |
| 7th Author's Affiliation | UV Craftory |
| 8th Author's Name | Takehiko FUJITA |
| 8th Author's Affiliation | UV Craftory |
| 9th Author's Name | Cyril PERNOT |
| 9th Author's Affiliation | UV Craftory |
| 10th Author's Name | Akira HIRANO |
| 10th Author's Affiliation | UV Craftory |
| Date | 2011-05-20 |
| Paper # | ED2011-24,CPM2011-31,SDM2011-37 |
| Volume (vol) | vol.111 |
| Number (no) | 44 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |