Presentation 2011-05-19
MOCVD growth of GaN on graphite substrates
Shinichi Kohda, Toshiyuki Takizawa, Nobuaki Nagao, Masahiro Ishida, Tetsuzo Ueda,
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Abstract(in English) We have successfully grown epitaxial GaN on graphite substrates by metal-organic chemical vapor deposition (MOCVD) with O_2 plasma treatment technique. The threading dislocation density of the obtained GaN layer is 2×10^9/cm^2, which is comparable to that of GaN on sapphire substrates. We have performed the first-principles calculation to investigate adsorption energies and adsorption sites for atomic species on graphite substrates. We found by the calculation that the adsorption energies on terrace edge sites of (0001) face are lower than those on terrace sites of (0001) face. These results suggest that the formation of terrace edge sites of (0001) face by the O_2 plasma treatment plays an important role to grow GaN on graphite substrates with good crystallinity.
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Keyword(in English) GaN / MOCVD / graphite / first-principles calculation
Paper # ED2011-14,CPM2011-21,SDM2011-27
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Committee CPM
Conference Date 2011/5/12(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) MOCVD growth of GaN on graphite substrates
Sub Title (in English)
Keyword(1) GaN
Keyword(2) MOCVD
Keyword(3) graphite
Keyword(4) first-principles calculation
1st Author's Name Shinichi Kohda
1st Author's Affiliation Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation()
2nd Author's Name Toshiyuki Takizawa
2nd Author's Affiliation Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
3rd Author's Name Nobuaki Nagao
3rd Author's Affiliation Advanced Technology Research Laboratories, Panasonic Corporation
4th Author's Name Masahiro Ishida
4th Author's Affiliation Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
5th Author's Name Tetsuzo Ueda
5th Author's Affiliation Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation
Date 2011-05-19
Paper # ED2011-14,CPM2011-21,SDM2011-27
Volume (vol) vol.111
Number (no) 45
Page pp.pp.-
#Pages 4
Date of Issue