Presentation 2011/5/12
Report of IEC/TC56 Dependability Limerick meeting 2010 and trend of standardization : Techniques for quantitative risk analysis and international standard proposal
Ko KAWASHIMA, Tsuneharu SHIMODAIRA, Yoshinobu SATO,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) The analysis techniques for dependability such as ETA, FTA and Markov techniques are used also for estimation of SIL(safety integrity level). We proposed the international standard for using such analysis techniques for occurrence probability calculation of a dangerous event at the IEC/TC56 Limerick meeting. This paper reports the summary of Limerick meeting and new standard proposal of techniques for quantitative risk analysis.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) IEC/TC56 / dependability / risk / quantitative / functional safety
Paper # SSS2011-3
Date of Issue

Conference Information
Committee SSS
Conference Date 2011/5/12(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Safety (SSS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Report of IEC/TC56 Dependability Limerick meeting 2010 and trend of standardization : Techniques for quantitative risk analysis and international standard proposal
Sub Title (in English)
Keyword(1) IEC/TC56
Keyword(2) dependability
Keyword(3) risk
Keyword(4) quantitative
Keyword(5) functional safety
1st Author's Name Ko KAWASHIMA
1st Author's Affiliation Oriental Motor Co., Ltd.()
2nd Author's Name Tsuneharu SHIMODAIRA
2nd Author's Affiliation InterRisk Research Institute & Consulting. Inc.:Tokyo University of Marine Science and Technology
3rd Author's Name Yoshinobu SATO
3rd Author's Affiliation Oriental Motor Co., Ltd.:InterRisk Research Institute & Consulting. Inc.:Tokyo University of Marine Science and Technology
Date 2011/5/12
Paper # SSS2011-3
Volume (vol) vol.111
Number (no) 42
Page pp.pp.-
#Pages 8
Date of Issue