Presentation | 2011-03-10 Likelihood Histogram for Fault Detection Masashi ANDO, Seiji HOTTA, Hisae SHIBUYA, Shunji MAEDA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper proposes a descriptor for multiple sensor sequences called likelihood histogram. In our descriptor, models are formed for individual sensors on each time using the Gaussian function. Through voting sensor values to them at each time, we obtain a histogram whose number of bins is equal to that of sensors. By using our descriptor, we can classify normal and fault days by commonly used classifiers such as support vector machine. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | multiple sensors / fault detection / likelihood histogram / pyramid representation |
Paper # | PRMU2010-259 |
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Committee | PRMU |
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Conference Date | 2011/3/3(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Pattern Recognition and Media Understanding (PRMU) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Likelihood Histogram for Fault Detection |
Sub Title (in English) | |
Keyword(1) | multiple sensors |
Keyword(2) | fault detection |
Keyword(3) | likelihood histogram |
Keyword(4) | pyramid representation |
1st Author's Name | Masashi ANDO |
1st Author's Affiliation | Tokyo University of Agriculture and Technology() |
2nd Author's Name | Seiji HOTTA |
2nd Author's Affiliation | Tokyo University of Agriculture and Technology |
3rd Author's Name | Hisae SHIBUYA |
3rd Author's Affiliation | Production Engineering Research Laboratory, Hitachi, Ltd. |
4th Author's Name | Shunji MAEDA |
4th Author's Affiliation | Production Engineering Research Laboratory, Hitachi, Ltd. |
Date | 2011-03-10 |
Paper # | PRMU2010-259 |
Volume (vol) | vol.110 |
Number (no) | 467 |
Page | pp.pp.- |
#Pages | 4 |
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