| Presentation | 2011-03-11 A Study of Degradation Phenomenon of electrical Contacts by some Oscillating Mechanisms : Modeling about Fluctuation of Contact Resistance Shin-ichi WADA, Keiji KOSHIDA, Saindaa NOROVLIN, Masahiro KAWANOBE, Masayoshi KOTABE, Hiroaki KUBOTA, Tohru IKEGUCHI, Yoshihiko HORIO, Koichiro SAWA, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried non-linear data processing in addition to usually linear one. It was considered that the process extracted the characteristic of time-sequential fluctuation of the contact resistance from experimental results. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | degradation phenomenon / electrical contact / oscillating mechanism / contact resistance / time-sequential data / non-linear processing |
| Paper # | NLP2010-196 |
| Date of Issue |
| Conference Information | |
| Committee | NLP |
|---|---|
| Conference Date | 2011/3/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Nonlinear Problems (NLP) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study of Degradation Phenomenon of electrical Contacts by some Oscillating Mechanisms : Modeling about Fluctuation of Contact Resistance |
| Sub Title (in English) | |
| Keyword(1) | degradation phenomenon |
| Keyword(2) | electrical contact |
| Keyword(3) | oscillating mechanism |
| Keyword(4) | contact resistance |
| Keyword(5) | time-sequential data |
| Keyword(6) | non-linear processing |
| 1st Author's Name | Shin-ichi WADA |
| 1st Author's Affiliation | TMC System Co., Ltd.() |
| 2nd Author's Name | Keiji KOSHIDA |
| 2nd Author's Affiliation | TMC System Co., Ltd. |
| 3rd Author's Name | Saindaa NOROVLIN |
| 3rd Author's Affiliation | TMC System Co., Ltd. |
| 4th Author's Name | Masahiro KAWANOBE |
| 4th Author's Affiliation | TMC System Co., Ltd. |
| 5th Author's Name | Masayoshi KOTABE |
| 5th Author's Affiliation | TMC System Co., Ltd. |
| 6th Author's Name | Hiroaki KUBOTA |
| 6th Author's Affiliation | TMC System Co., Ltd. |
| 7th Author's Name | Tohru IKEGUCHI |
| 7th Author's Affiliation | Saitama University |
| 8th Author's Name | Yoshihiko HORIO |
| 8th Author's Affiliation | Tokyo Denki University |
| 9th Author's Name | Koichiro SAWA |
| 9th Author's Affiliation | Keio University:Nippon Institute of Technology |
| Date | 2011-03-11 |
| Paper # | NLP2010-196 |
| Volume (vol) | vol.110 |
| Number (no) | 465 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |