Presentation 2011-03-08
Photodegradation dynamics ofpolyfluorene thin films studied by means of photoluminescence spectroscopy : Influence of residual oxygen
Masanori NAKAGAWA, Takashi KOBAYASHI, Takashi NAGASE, Hiroyoshi NAITO,
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Abstract(in English) Polyfluorene (PFO) has been extensively studied as an efficient blue emitter for organic light-emitting diodes (OLED). However, degradation of PFO occurs under device operation and then results in emission color change due to appearance of a new green-emission band. The origin of the green-emission band has not been revealed yet due to the complex device structure of OLED. In this study, we find out that UV irradiation to sealed PFO results in the appearance of the green-emission band without the OLED device structure. This new method allows us to investigate the characteristics of the green-emission band taking out the influence of the other degradation phenomena. By means of this method, we conclude that the origin of the green-emission band is different from that of the decrease in EL efficiency or decrease in solubility of the polymer caused by device operation. We also find that the green-emission band only causes under the completely oxygen-free condition. Finally, we conclude that conjugated electron accepter unit, such as benzothiadiazole units, could suppress the color instability.
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Keyword(in English) fluorene / color instability / photoluminescence / green-emission band / degradation
Paper # OME2010-80
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Committee OME
Conference Date 2011/3/1(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Photodegradation dynamics ofpolyfluorene thin films studied by means of photoluminescence spectroscopy : Influence of residual oxygen
Sub Title (in English)
Keyword(1) fluorene
Keyword(2) color instability
Keyword(3) photoluminescence
Keyword(4) green-emission band
Keyword(5) degradation
1st Author's Name Masanori NAKAGAWA
1st Author's Affiliation Graduate School of Engineering, Osaka Prefecture University()
2nd Author's Name Takashi KOBAYASHI
2nd Author's Affiliation Graduate School of Engineering, Osaka Prefecture University:The Research Institute for Molecular Electronic Devices, Osaka Prefecture University
3rd Author's Name Takashi NAGASE
3rd Author's Affiliation Graduate School of Engineering, Osaka Prefecture University:The Research Institute for Molecular Electronic Devices, Osaka Prefecture University
4th Author's Name Hiroyoshi NAITO
4th Author's Affiliation Graduate School of Engineering, Osaka Prefecture University:The Research Institute for Molecular Electronic Devices, Osaka Prefecture University
Date 2011-03-08
Paper # OME2010-80
Volume (vol) vol.110
Number (no) 463
Page pp.pp.-
#Pages 4
Date of Issue