Presentation	2011-02-18 Detection of degradation sign of LSI operation using I_ Shunsuke SAKAMOTO, Masaru SANADA,
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Abstract(in English)	V_ supply current (I_) information has been applied to detect LSI evaluation technology, I_ which has high fault detection sensitivity comparison with logic information. We used the I_ data to confirm degradation sign of LSI operation. For identification of early degradation with tiny leakage current, and clear detection of leakage current value growth brought with degradation progress, mathematical analysis way is worked. The technology is that data between test vector number versus I_ value is converted by Fourier transformation and is fabricated to power spectrum, which actualizes degradation sign. As a result, progress from tiny change of about 1/1000 on normal value was measured. Controversial points are discussed for prediction times of circuit operation down.
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Keyword(in English)	I_ / LSI / Degradation / Fourier Transformation / Power spectrum
Paper #	R2010-46,EMD2010-147
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Committee	R
Conference Date	2011/2/11(1days)
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Paper Information
Registration To	Reliability(R)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Detection of degradation sign of LSI operation using I_
Sub Title (in English)
Keyword(1)	I_
Keyword(2)	LSI
Keyword(3)	Degradation
Keyword(4)	Fourier Transformation
Keyword(5)	Power spectrum
1st Author's Name	Shunsuke SAKAMOTO
1st Author's Affiliation	Faculty of Engineering, Kochi University of Technology()
2nd Author's Name	Masaru SANADA
2nd Author's Affiliation	Faculty of Engineering, Kochi University of Technology
Date	2011-02-18
Paper #	R2010-46,EMD2010-147
Volume (vol)	vol.110
Number (no)	415
Page	pp.pp.-
#Pages	6
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