Presentation | 2011-03-04 The Method for detecting Silent failures in Virtual Networks Nobuyuki NAKAMURA, Satoshi IKADA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Now we have lots of opportunities to use the Virtual Network technologies like VPN, Cloud, etc. These virtual networks treat many kind of application flows (which are VoIP, MoIP, and data transition), and exchange a huge amount of traffic. However for the internet (as an under layer network) they are only Virtual Network's data packets and the internet operators can't know what type of traffic they transferred. Moreover Virtual Network technologies may have autonomous self-organization functions, so they can avoid the internet's silent failures and some kind of quality degradations to keep their network good. Thus we need the method to estimate the quality parameters (jitter and lost packets) from such data flows at the point of gateway equipments and the method to infer the silent failure points from the estimated quality parameters, estimated Virtual Network's re-route, and network tomography. In this paper, we propose these methods and evaluate whether the estimating quality parameters are used as the useful quality parameters or not. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Virtual Network / QoS Degradation / Silent Failures / Network Tomography |
Paper # | IN2010-182 |
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Committee | IN |
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Conference Date | 2011/2/24(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Information Networks (IN) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | The Method for detecting Silent failures in Virtual Networks |
Sub Title (in English) | |
Keyword(1) | Virtual Network |
Keyword(2) | QoS Degradation |
Keyword(3) | Silent Failures |
Keyword(4) | Network Tomography |
1st Author's Name | Nobuyuki NAKAMURA |
1st Author's Affiliation | Corporate Research & Development Center, Oki Electric Industry Co., Ltd.() |
2nd Author's Name | Satoshi IKADA |
2nd Author's Affiliation | Corporate Research & Development Center, Oki Electric Industry Co., Ltd. |
Date | 2011-03-04 |
Paper # | IN2010-182 |
Volume (vol) | vol.110 |
Number (no) | 449 |
Page | pp.pp.- |
#Pages | 6 |
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