Presentation 2011-03-04
The Method for detecting Silent failures in Virtual Networks
Nobuyuki NAKAMURA, Satoshi IKADA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Now we have lots of opportunities to use the Virtual Network technologies like VPN, Cloud, etc. These virtual networks treat many kind of application flows (which are VoIP, MoIP, and data transition), and exchange a huge amount of traffic. However for the internet (as an under layer network) they are only Virtual Network's data packets and the internet operators can't know what type of traffic they transferred. Moreover Virtual Network technologies may have autonomous self-organization functions, so they can avoid the internet's silent failures and some kind of quality degradations to keep their network good. Thus we need the method to estimate the quality parameters (jitter and lost packets) from such data flows at the point of gateway equipments and the method to infer the silent failure points from the estimated quality parameters, estimated Virtual Network's re-route, and network tomography. In this paper, we propose these methods and evaluate whether the estimating quality parameters are used as the useful quality parameters or not.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Virtual Network / QoS Degradation / Silent Failures / Network Tomography
Paper # IN2010-182
Date of Issue

Conference Information
Committee IN
Conference Date 2011/2/24(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Information Networks (IN)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The Method for detecting Silent failures in Virtual Networks
Sub Title (in English)
Keyword(1) Virtual Network
Keyword(2) QoS Degradation
Keyword(3) Silent Failures
Keyword(4) Network Tomography
1st Author's Name Nobuyuki NAKAMURA
1st Author's Affiliation Corporate Research & Development Center, Oki Electric Industry Co., Ltd.()
2nd Author's Name Satoshi IKADA
2nd Author's Affiliation Corporate Research & Development Center, Oki Electric Industry Co., Ltd.
Date 2011-03-04
Paper # IN2010-182
Volume (vol) vol.110
Number (no) 449
Page pp.pp.-
#Pages 6
Date of Issue