Presentation | 2011-02-23 Capacitance measurements of sub-micron Al junctions using SQUID resonance Kento KIKUCHI, Masataka MORIYA, Hiroshi SHIMADA, Yoshinao MIZUGAKI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is necessary to extract the capacitances, resistances and inductances experimentally for fabrication sub-micron Al junction device. We have obtained these device parameters using SQUID resonance techniques with sub-micron Al junctions evaluated by means of direct current injections. The results ofcapacitance are 54~1 70fF/μm^2. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Superconductor / Josephson-Junction / SQUID / tunnel junction / inductance / capacitance |
Paper # | ED2010-199,SDM2010-234 |
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Committee | ED |
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Conference Date | 2011/2/16(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Capacitance measurements of sub-micron Al junctions using SQUID resonance |
Sub Title (in English) | |
Keyword(1) | Superconductor |
Keyword(2) | Josephson-Junction |
Keyword(3) | SQUID |
Keyword(4) | tunnel junction |
Keyword(5) | inductance |
Keyword(6) | capacitance |
1st Author's Name | Kento KIKUCHI |
1st Author's Affiliation | Department of Electro Engineering, The Univercity of Electro Communications() |
2nd Author's Name | Masataka MORIYA |
2nd Author's Affiliation | Department of Engineering Science, The Univercity of Electro Communications |
3rd Author's Name | Hiroshi SHIMADA |
3rd Author's Affiliation | Department of Engineering Science, The Univercity of Electro Communications |
4th Author's Name | Yoshinao MIZUGAKI |
4th Author's Affiliation | Department of Engineering Science, The Univercity of Electro Communications |
Date | 2011-02-23 |
Paper # | ED2010-199,SDM2010-234 |
Volume (vol) | vol.110 |
Number (no) | 423 |
Page | pp.pp.- |
#Pages | 6 |
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