Presentation 2011-04-12
An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults
Satoshi FUKUMOTO, Kenta IMAI, Hideo KOHINATA, Masayuki ARAI,
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Abstract(in English) This paper discusses the extension of highly reliable technique for sequential circuits using duplicate register which has been already presented by author's research group. A new approach by triplicate register enables the circuit to recover even in the case that simultaneous occurrence of multiple transient faults continues for 2 clock cycles. The concrete microprocessor for applying this technique is constructed to exhibit actually enhanced dependability. Overhead on circuit area is estimated and the fault tolerance under our assumptions is confirmed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) transient fault / highly reliable sequential circuit / simultaneous multiple faults
Paper # CPSY2011-1,DC2011-1
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Committee DC
Conference Date 2011/4/5(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults
Sub Title (in English)
Keyword(1) transient fault
Keyword(2) highly reliable sequential circuit
Keyword(3) simultaneous multiple faults
1st Author's Name Satoshi FUKUMOTO
1st Author's Affiliation Faculty of System Design, Tokyo Metropolitan University()
2nd Author's Name Kenta IMAI
2nd Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
3rd Author's Name Hideo KOHINATA
3rd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
4th Author's Name Masayuki ARAI
4th Author's Affiliation Faculty of System Design, Tokyo Metropolitan University
Date 2011-04-12
Paper # CPSY2011-1,DC2011-1
Volume (vol) vol.111
Number (no) 2
Page pp.pp.-
#Pages 4
Date of Issue