| Presentation | 2011-02-14 Test Pattern Generation for Highly Accurate Delay Testing Keigo HORI, Tomokazu YONEDA, Michiko INOUE, Hideo FUJIWARA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We propose a new faster-than-at-speed test method to detect small delay defects. As semiconductor technology is scaling down, transistor aging such as NBTI and TDDB becomes major concern on field reliability. Since these aging mechanisms manifest as gradual delay increase, it is possible to predict system failure by detecting small delay increase. In this paper, we consider two criterions on capability of small delay defect detection, and propose two test pattern generation method for both criterions, respectively. Experimental results demonstrate the effectiveness of the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Delay Test / Test Response Masking / Small Delay Defect / Aging / Field test |
| Paper # | DC2010-64 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2011/2/7(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Test Pattern Generation for Highly Accurate Delay Testing |
| Sub Title (in English) | |
| Keyword(1) | Delay Test |
| Keyword(2) | Test Response Masking |
| Keyword(3) | Small Delay Defect |
| Keyword(4) | Aging |
| Keyword(5) | Field test |
| 1st Author's Name | Keigo HORI |
| 1st Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST() |
| 2nd Author's Name | Tomokazu YONEDA |
| 2nd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 3rd Author's Name | Michiko INOUE |
| 3rd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| 4th Author's Name | Hideo FUJIWARA |
| 4th Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology:Japan Science and Technology Agency, CREST |
| Date | 2011-02-14 |
| Paper # | DC2010-64 |
| Volume (vol) | vol.110 |
| Number (no) | 413 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |