Presentation 2011-01-28
High-gain operation of avalanche photodiode with InP/InGaAs new structures
Masahiro NADA, Yoshifumi MURAMOTO, Haruki YOKOYAMA, Naoteru SHIGEKAWA, Satoshi KODAMA,
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Abstract(in English) Due to higher voltage operation than that of conventional photodiodes (PDs), electrical field need to be confined inside the device for highly reliable avalanche photodiodes (APDs). To improve their reliability, several device structures with using selective diffusion or ion implantation techniques have been demonstrated. However, they make their fabrication processes complex. This paper describes a new structure of APD that highly confines electric field inside the device, which is fabricated by simpler processes. Fabricated APD has comparable characteristics to the conventional APDs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Avalanche photodiode / guard-ring free / mesa structure / high-gain operation
Paper # PN2010-44,OPE2010-157,LQE2010-142
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Committee LQE
Conference Date 2011/1/20(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High-gain operation of avalanche photodiode with InP/InGaAs new structures
Sub Title (in English)
Keyword(1) Avalanche photodiode
Keyword(2) guard-ring free
Keyword(3) mesa structure
Keyword(4) high-gain operation
1st Author's Name Masahiro NADA
1st Author's Affiliation NTT Photonics Laboratories, NTT Corporation()
2nd Author's Name Yoshifumi MURAMOTO
2nd Author's Affiliation NTT Photonics Laboratories, NTT Corporation
3rd Author's Name Haruki YOKOYAMA
3rd Author's Affiliation NTT Photonics Laboratories, NTT Corporation
4th Author's Name Naoteru SHIGEKAWA
4th Author's Affiliation NTT Photonics Laboratories, NTT Corporation
5th Author's Name Satoshi KODAMA
5th Author's Affiliation NTT Photonics Laboratories, NTT Corporation
Date 2011-01-28
Paper # PN2010-44,OPE2010-157,LQE2010-142
Volume (vol) vol.110
Number (no) 396
Page pp.pp.-
#Pages 4
Date of Issue