| Presentation | 2011-01-28 Degradation Phenomenon of Electrical Contacts by a Tapping Device : A tapping device for trial (1) Shin-ichi WADA, Keiji KOSHIDA, Saindaa NOROVLING, Masahiro KAWANOBE, Daiki ISHIZUKA, Kunio YANAGI, Masayoshi KOTABE, Hiroaki KUBOTA, Nobuhiro KUGA, Koichiro SAWA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering oscillation mechanism (HOM), a sliding contact mechanism (SCM) and a 3 dimensional oscillating mechanism (3DOM). However, it was difficult to inspect the degradation phenomenon of electrical contacts in relatively larger systems or in equipments in the field by means of the mechanisms in which the objective materials were requested to be on the stage. Therefore they have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection but with quantitative property to some extent. It was suggested that the device could provide the oscillations for the objects with constant loads and energies but without regard to proficient operators' skills. And it was shown that the dynamical characteristics of the device were able to be analyzed by virtue of mathematical and mechanical models. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electrical contact / micro-oscillation / contact resistance / tapping device / hammering oscillating mechanism |
| Paper # | EMD2010-141 |
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| Conference Information | |
| Committee | EMD |
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| Conference Date | 2011/1/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Phenomenon of Electrical Contacts by a Tapping Device : A tapping device for trial (1) |
| Sub Title (in English) | |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | tapping device |
| Keyword(5) | hammering oscillating mechanism |
| 1st Author's Name | Shin-ichi WADA |
| 1st Author's Affiliation | TMC System Co., Ltd.() |
| 2nd Author's Name | Keiji KOSHIDA |
| 2nd Author's Affiliation | TMC System Co., Ltd. |
| 3rd Author's Name | Saindaa NOROVLING |
| 3rd Author's Affiliation | TMC System Co., Ltd. |
| 4th Author's Name | Masahiro KAWANOBE |
| 4th Author's Affiliation | TMC System Co., Ltd. |
| 5th Author's Name | Daiki ISHIZUKA |
| 5th Author's Affiliation | TMC System Co., Ltd. |
| 6th Author's Name | Kunio YANAGI |
| 6th Author's Affiliation | TMC System Co., Ltd. |
| 7th Author's Name | Masayoshi KOTABE |
| 7th Author's Affiliation | TMC System Co., Ltd. |
| 8th Author's Name | Hiroaki KUBOTA |
| 8th Author's Affiliation | TMC System Co., Ltd. |
| 9th Author's Name | Nobuhiro KUGA |
| 9th Author's Affiliation | Yokohama National University |
| 10th Author's Name | Koichiro SAWA |
| 10th Author's Affiliation | Keio University:Nippon Institute of Technology |
| Date | 2011-01-28 |
| Paper # | EMD2010-141 |
| Volume (vol) | vol.110 |
| Number (no) | 403 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |