Presentation 2011-01-28
Current-Voltage Characteristics of Top-Emission Printed EL Devices Using Solution-Processed ZnO Nanocrystals
Kazuki ITATANI, Hayato KAWASAKI, Toshihiko TOYAMA, Hiroaki OKAMOTO,
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Abstract(in English) Current-voltage (J-V) measurements were performed on the top-emission EL devices with a printed emission layer involving solution-processed ZnO nanocrystals. The temperature dependence of J-V characteristics suggested the deposition method and the deposition conditions of top anodes play a crucial role in determining UV emission intensity.
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Keyword(in English) nanocrystal / EL / solution-process / ZnO / exciton recombination / screen-printng
Paper # EID2010-30
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Committee EID
Conference Date 2011/1/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Current-Voltage Characteristics of Top-Emission Printed EL Devices Using Solution-Processed ZnO Nanocrystals
Sub Title (in English)
Keyword(1) nanocrystal
Keyword(2) EL
Keyword(3) solution-process
Keyword(4) ZnO
Keyword(5) exciton recombination
Keyword(6) screen-printng
1st Author's Name Kazuki ITATANI
1st Author's Affiliation Graduate School of Engineering Science, Osaka University()
2nd Author's Name Hayato KAWASAKI
2nd Author's Affiliation Graduate School of Engineering Science, Osaka University
3rd Author's Name Toshihiko TOYAMA
3rd Author's Affiliation Graduate School of Engineering Science, Osaka University
4th Author's Name Hiroaki OKAMOTO
4th Author's Affiliation Graduate School of Engineering Science, Osaka University
Date 2011-01-28
Paper # EID2010-30
Volume (vol) vol.110
Number (no) 404
Page pp.pp.-
#Pages 4
Date of Issue