| Presentation | 2010-12-17 Comparison of the Error Correction Methods for SSDs and Dynamic Codeword Transition ECC Scheme Shuhei TANAKAMARU, Atsushi ESUMI, Mitsuyoshi ITO, Kai LI, Ken TAKEUCHI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper compares error correcting codes (ECC) such as RS code and BCH code as an ECC for SSDs and introduces dynamic codeword transition ECC scheme for highly reliable SSDs. By monitoring the error number or the write / erase cycles, the ECC codeword dynamically increases from 512Byte (+parity) to 1KByte, 2KByte, 4KByte...32KByte. The proposed ECC with a larger codeword decreases the failure rate after ECC. Because the parity rate per codeword is the same in each ECC codeword, no additional memory area is required so that the reliability of SSD is improved after the manufacturing without cost penalty. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ECC / Error correcting code / SSD / NAND Flash memory |
| Paper # | ICD2010-124 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2010/12/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Comparison of the Error Correction Methods for SSDs and Dynamic Codeword Transition ECC Scheme |
| Sub Title (in English) | |
| Keyword(1) | ECC |
| Keyword(2) | Error correcting code |
| Keyword(3) | SSD |
| Keyword(4) | NAND Flash memory |
| 1st Author's Name | Shuhei TANAKAMARU |
| 1st Author's Affiliation | Dept. of Electrical Engineering and Information Systems, University of Tokyo() |
| 2nd Author's Name | Atsushi ESUMI |
| 2nd Author's Affiliation | SIGLEAD Inc. |
| 3rd Author's Name | Mitsuyoshi ITO |
| 3rd Author's Affiliation | SIGLEAD Inc. |
| 4th Author's Name | Kai LI |
| 4th Author's Affiliation | SIGLEAD Inc. |
| 5th Author's Name | Ken TAKEUCHI |
| 5th Author's Affiliation | Dept. of Electrical Engineering and Information Systems, University of Tokyo |
| Date | 2010-12-17 |
| Paper # | ICD2010-124 |
| Volume (vol) | vol.110 |
| Number (no) | 344 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |