| Presentation | 2010-12-16 Evaluation of power noise in SRAM core Taku Toshikawa, Tsubasa Masui, Takuya Sawada, Makoto Nagata, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Power noise of SRAM operation is evaluated with a test chip fabricated in a 90-nm CMOS technology. The chip includes on-die voltage monitors, BIST structures for failure bit detection and analysis, and a set of SRAM macros with different bit and word specifications. Power and ground noise waveforms are measured and compared in a variety of operation conditions in both user and BIST modes. It is found that power noise depends on an operating frequency of memory, in terms of their average and amplitudes. We are challenging to relate power noise and bit failures, by using automatic measurement systems of power noise, bit error rate, and fail bit map. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | SRAM / Power noise / on-die voltage monitor |
| Paper # | ICD2010-112 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2010/12/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of power noise in SRAM core |
| Sub Title (in English) | |
| Keyword(1) | SRAM |
| Keyword(2) | Power noise |
| Keyword(3) | on-die voltage monitor |
| 1st Author's Name | Taku Toshikawa |
| 1st Author's Affiliation | Dept. of System Science , Kobe Univercity() |
| 2nd Author's Name | Tsubasa Masui |
| 2nd Author's Affiliation | Dept. of System Science , Kobe Univercity |
| 3rd Author's Name | Takuya Sawada |
| 3rd Author's Affiliation | Dept. of System Science , Kobe Univercity |
| 4th Author's Name | Makoto Nagata |
| 4th Author's Affiliation | Dept. of System Science , Kobe Univercity |
| Date | 2010-12-16 |
| Paper # | ICD2010-112 |
| Volume (vol) | vol.110 |
| Number (no) | 344 |
| Page | pp.pp.- |
| #Pages | 4 |
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