| Presentation | 2010-12-16 A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor Takashi MATSUMOTO, Hiroaki MAKINO, Kazutoshi KOBAYASHI, Hidetoshi ONODERA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We proposed an NBTI-recovery sensor with 400ns measurement delay. This sensor contains many unit cells. One unit cell includes ten PMOS DUTs and two assist NMOSes. Parallelizing many unit cells can amplify the leakage current and the assist circuit can reduce the rush current to the ammeter that keeps the measurement range of ammeter constant during measurement. Fast measurement delay is achieved by these two factors. It is confirmed that from 50℃ to 125℃, NBTI recovery follows log t from 400ns to 3000s. By degrading and recovering thousands of PMOS transistors at the same time, we can observe that the time constants of positively charged defects which are related to NBTI are log-uniformly distributed in the PMOS devices. Also this circuit has the highest fidelity to NBTI recovery measurement because off-leak current is used for NBTI recovery characterization and stress is not added during measurement. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | dependable VLSI / CMOS / NBTI |
| Paper # | ICD2010-104 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2010/12/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor |
| Sub Title (in English) | |
| Keyword(1) | dependable VLSI |
| Keyword(2) | CMOS |
| Keyword(3) | NBTI |
| 1st Author's Name | Takashi MATSUMOTO |
| 1st Author's Affiliation | Graduate School of Informatics, Kyoto University() |
| 2nd Author's Name | Hiroaki MAKINO |
| 2nd Author's Affiliation | Graduate School of Informatics, Kyoto University |
| 3rd Author's Name | Kazutoshi KOBAYASHI |
| 3rd Author's Affiliation | Graduate School of Science and Technology, Kyoto Institute of Technology:JST CREST |
| 4th Author's Name | Hidetoshi ONODERA |
| 4th Author's Affiliation | Graduate School of Informatics, Kyoto University:JST CREST |
| Date | 2010-12-16 |
| Paper # | ICD2010-104 |
| Volume (vol) | vol.110 |
| Number (no) | 344 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |