| Presentation | 2010-12-10 Quantification of Small Devices using EMI Test Instrument with Microstripline Structure Erika KAWABATA, Kazuyuki SAKIYAMA, Toru YAMADA, Toshihiko TANIGUCHI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, a great demand for the execution of EMC tests to electric small devices has increased. In this paper, novel measuring method for EMI observation of electric device radiation noise is proposed. The instrument is constructed by microstripline structure which have been already applied for our EMS testing. It has high sensitivity for weak noise power and effective to use multi-usage EMC evaluation. At first, the noise detection performance of this instrument by measuring the small emission noise quantitatively is evaluated, and this maicrostripline structure get better performance compared to the ordinary TEM cell instrument. Next, by using of standard antenna model which approximate noise source, the noise detection performance is evaluated by experiment and analysis from 30MHz to 2.5GHz band. Furthermore, less than 500MHz band, the noise detection performance depends on formdevice shape and position, because of capacitance coupling between microstripline and DUT. Finally, the calibration method for noise quantification is proposed. This EMI evaluation method using the test instrument of the microstripline structure is very effective as well as EMS evaluation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EMC / Microstripline / TEM mode / Magnetic field coupling / Electric field coupling |
| Paper # | EMCJ2010-94 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2010/12/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Quantification of Small Devices using EMI Test Instrument with Microstripline Structure |
| Sub Title (in English) | |
| Keyword(1) | EMC |
| Keyword(2) | Microstripline |
| Keyword(3) | TEM mode |
| Keyword(4) | Magnetic field coupling |
| Keyword(5) | Electric field coupling |
| 1st Author's Name | Erika KAWABATA |
| 1st Author's Affiliation | Panasonic Photo & Lighting Co., Ltd.() |
| 2nd Author's Name | Kazuyuki SAKIYAMA |
| 2nd Author's Affiliation | Panasonic Co., Ltd. |
| 3rd Author's Name | Toru YAMADA |
| 3rd Author's Affiliation | Panasonic Co., Ltd. |
| 4th Author's Name | Toshihiko TANIGUCHI |
| 4th Author's Affiliation | Panasonic Photo & Lighting Co., Ltd. |
| Date | 2010-12-10 |
| Paper # | EMCJ2010-94 |
| Volume (vol) | vol.110 |
| Number (no) | 332 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |