| Presentation | 2010-12-10 An Immunity Test Method Insensitive to Arrangements of Equipment Under Test for Indirect Discharges of ESD Gun onto Tapered Vertical Coupling Plane Takuro TSUJI, Kouji HIMENO, Yoshinori TAKA, Osamu FUJIWARA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | International Electrotechnical Commission (IEC) prescribes immunity tests (IEC61000-4-2) of electronic equipment against electrostatic discharge (ESDs), and specifies indirect discharges of an ESD gun onto a vertical coupling plane (VCP) in the vicinity of equipment under test (EUT) for simulating personal discharges to conductive materials being adjacent to the EUT. According to IEC 61000-4-2 2008-04, the VCP shall be placed at a distance of 0.1m from the EUT, and the indirect discharges of an ESD gun should be conducted to the centre of a vertical edge of the VCP, though the reference arrangement of EUT is not specifically determined. In the previous study, we measured electromagnetic fields due to indirect discharges of an ESD gun onto a VCP to investigate their variations with respect to EUT positions, which showed that indirect discharges onto a vertical edge from the back side of a VCP are very likely to reduce the above-mentioned variations, while the induced voltage levels become low. In the present study, to improve this problem, we used a tapered VCP in lieu of the IEC-specified VCP, and by using a magnetic field probe in place of EUT, we measured its induced voltages for indirect discharges of an ESD gun onto the VCP, and examined the variations in peaks and waveform energies with respect to the probe positions. As a result, we found that the tapered VCP suppresses the variations in peaks by 60% and waveform energies by 50% compared to the IEC specified VCP. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ESD / IEC standard / Indirect discharges / tapered vertical coupling plane / induced voltages / variations. |
| Paper # | EMCJ2010-92 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2010/12/3(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Immunity Test Method Insensitive to Arrangements of Equipment Under Test for Indirect Discharges of ESD Gun onto Tapered Vertical Coupling Plane |
| Sub Title (in English) | |
| Keyword(1) | ESD |
| Keyword(2) | IEC standard |
| Keyword(3) | Indirect discharges |
| Keyword(4) | tapered vertical coupling plane |
| Keyword(5) | induced voltages |
| Keyword(6) | variations. |
| 1st Author's Name | Takuro TSUJI |
| 1st Author's Affiliation | Graduate School of Engineering, Nagoya Institute of Technology() |
| 2nd Author's Name | Kouji HIMENO |
| 2nd Author's Affiliation | Graduate School of Engineering, Nagoya Institute of Technology |
| 3rd Author's Name | Yoshinori TAKA |
| 3rd Author's Affiliation | Kushiro National College of Technology |
| 4th Author's Name | Osamu FUJIWARA |
| 4th Author's Affiliation | Graduate School of Engineering, Nagoya Institute of Technology |
| Date | 2010-12-10 |
| Paper # | EMCJ2010-92 |
| Volume (vol) | vol.110 |
| Number (no) | 332 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |