Presentation | 2011/1/13 Influences on Jitter Characteristics of Digital Audio Interface by the AC Power Condition Hiroki KOYAMA, Atsushi HATA, Takahiro YOSHIDA, Noriaki MASUI, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is said that the sound quality and perceptible sound scape are different by the condition of AC power supplied to the audio equipment. Therefore, it is necessary to measure these phenomena and clarify their mechanism. In this study, we measured the effects of the AC power condition on jitter of DAT and that of digital sound equipment on the DAT jitter against operating time. From results, it is found that the AC power with harmonic voltage affects 2.3% differences in standard deviation of the TIE. In addition, it is also found that the operating time of digital audio equipment affects to the RMS and shape of waveforms of the DAT. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Jitter / TIE(Time Interval Error) / S/PDIF / Harmonic Voltage |
Paper # | US2010-105 |
Date of Issue |
Conference Information | |
Committee | US |
---|---|
Conference Date | 2011/1/13(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Ultrasonics (US) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Influences on Jitter Characteristics of Digital Audio Interface by the AC Power Condition |
Sub Title (in English) | |
Keyword(1) | Jitter |
Keyword(2) | TIE(Time Interval Error) |
Keyword(3) | S/PDIF |
Keyword(4) | Harmonic Voltage |
1st Author's Name | Hiroki KOYAMA |
1st Author's Affiliation | Department of Electrical Engineering, Tokyo University of Science() |
2nd Author's Name | Atsushi HATA |
2nd Author's Affiliation | Department of Electrical Engineering, Tokyo University of Science |
3rd Author's Name | Takahiro YOSHIDA |
3rd Author's Affiliation | Department of Electrical Engineering, Tokyo University of Science |
4th Author's Name | Noriaki MASUI |
4th Author's Affiliation | Department of Electrical Engineering, Tokyo University of Science |
Date | 2011/1/13 |
Paper # | US2010-105 |
Volume (vol) | vol.110 |
Number (no) | 366 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |