Presentation 2011-01-27
Measurement range elongation based on a temporal gating scheme in Brillouin optical correlation domain distributed discrimination system for strain and temperature operated by a single laser
Rodrigo Kendy YAMASHITA, Weiwen ZOU, Zuyuan HE, Kazuo HOTATE,
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Abstract(in English) We have demonstrated distributed discrimination of strain and temperature by localizing and scanning both the Stimulated Brillouin scattering (SBS) and the Brillouin dynamic grating (BDG) along a polarization maintaining fiber, with elongated measurement range. The localization and scanning is performed by a correlation domain technique, whose measurement range is restricted by the distance between consecutive correlation peaks. To overcome this restriction, we applied a temporal gating scheme to the system, enlarging the measurement range from浴`8m to ~500m. Here, we report the results confirming the effectiveness of this scheme in a system operated by a single laser source and demonstrate strain-temperature discrimination when strain or temperature is applied to segments on the 500-m-long fiber under test.
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Keyword(in English) Stimulated Brillouin scattering / Brillouin dynamic grating / fiber optic sensors / strain and temperature discrimination / BOCDA / temporal gating scheme
Paper # OFT2010-53
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Committee OFT
Conference Date 2011/1/20(1days)
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Registration To Optical Fiber Technology (OFT)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement range elongation based on a temporal gating scheme in Brillouin optical correlation domain distributed discrimination system for strain and temperature operated by a single laser
Sub Title (in English)
Keyword(1) Stimulated Brillouin scattering
Keyword(2) Brillouin dynamic grating
Keyword(3) fiber optic sensors
Keyword(4) strain and temperature discrimination
Keyword(5) BOCDA
Keyword(6) temporal gating scheme
1st Author's Name Rodrigo Kendy YAMASHITA
1st Author's Affiliation Faculty of Engineering, The University of Tokyo()
2nd Author's Name Weiwen ZOU
2nd Author's Affiliation Dept. of Electronic Engineering, Shanghai Jiao Tong University
3rd Author's Name Zuyuan HE
3rd Author's Affiliation Faculty of Engineering, The University of Tokyo
4th Author's Name Kazuo HOTATE
4th Author's Affiliation Faculty of Engineering, The University of Tokyo
Date 2011-01-27
Paper # OFT2010-53
Volume (vol) vol.110
Number (no) 397
Page pp.pp.-
#Pages 6
Date of Issue