Presentation | 2011-01-28 A study of breaking characteristics of MCCB in the use of Higher Voltage Direct Current (HVDC) distribution system Masatoshi NORITAKE, Tomohito USHIROKAWA, Keiichi HIROSE, Masato MINO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | HVDC system has been drawing attention for its energy saving and high reliability. This paper considers the applicability of the existing direct-current breaker as the breaker for HVDC system. To examine the breaking characteristic during the short-circuit current break, which has been one of the foremost concerns, HVDC system was structured to demonstrate the short-circuit accidents. As a result, it is verified that it is possible to break the short-circuit safely and influence from the break is not a problem for ICT equipments at the operational level. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Higher Voltage Direct Current (HVDC) / short-circuit / MCCB / Voltage dip |
Paper # | EE2010-34 |
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Conference Information | |
Committee | EE |
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Conference Date | 2011/1/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Energy Engineering in Electronics and Communications (EE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A study of breaking characteristics of MCCB in the use of Higher Voltage Direct Current (HVDC) distribution system |
Sub Title (in English) | |
Keyword(1) | Higher Voltage Direct Current (HVDC) |
Keyword(2) | short-circuit |
Keyword(3) | MCCB |
Keyword(4) | Voltage dip |
1st Author's Name | Masatoshi NORITAKE |
1st Author's Affiliation | NTT Facilities Inc., R&D Headquarters() |
2nd Author's Name | Tomohito USHIROKAWA |
2nd Author's Affiliation | NTT Facilities Inc., R&D Headquarters |
3rd Author's Name | Keiichi HIROSE |
3rd Author's Affiliation | NTT Facilities Inc., R&D Headquarters |
4th Author's Name | Masato MINO |
4th Author's Affiliation | NTT Facilities Inc., R&D Headquarters |
Date | 2011-01-28 |
Paper # | EE2010-34 |
Volume (vol) | vol.110 |
Number (no) | 393 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |