Presentation 2011-01-24
An integrated cryogenic current comparator with type-II structure
Takahiro YAMADA, Masaaki MAEZAWA, Michitaka MARUYAMA, Takehiko OE, Chiharu URANO, Nobu-hisa KANEKO, Mutsuo HIDAKA, Tetsuro SATOH, Shuichi NAGASAWA, Kenji HINODE,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We calculated superconductor inductances of a type-II integrated cryogenic current comparator (ICCC). First, inductances of a flip-chip-based superconducting quantum interference device (SQUID) were calculated using an electromagnetic field simulator. The results agreed with experimental results within an error of 20%. The simulations were also done for the type-II ICCC. The results showed an agreement with the approximated formula within an error of 50%. Finally, we made guidelines for designing the type-II ICCC based on those simulated results. We concluded that the number of winding turns of 50000 and a sensitivity of 0.32 pH/turn will be obtained by using six superconducting layers with a line & space of 1.5 μm & 1.5 μm on an 18 mm×18 mm chip.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Cryogenic Current Comparator / Integrated Cryogenic Current Comparator / Superconducting Circuit / Solenoid / superconducting quantum interference device / Inductance / Electromagnetic Analysis
Paper # SCE2010-41
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Conference Information
Committee SCE
Conference Date 2011/1/17(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An integrated cryogenic current comparator with type-II structure
Sub Title (in English)
Keyword(1) Cryogenic Current Comparator
Keyword(2) Integrated Cryogenic Current Comparator
Keyword(3) Superconducting Circuit
Keyword(4) Solenoid
Keyword(5) superconducting quantum interference device
Keyword(6) Inductance
Keyword(7) Electromagnetic Analysis
1st Author's Name Takahiro YAMADA
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)()
2nd Author's Name Masaaki MAEZAWA
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Michitaka MARUYAMA
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Takehiko OE
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Chiharu URANO
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name Nobu-hisa KANEKO
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
7th Author's Name Mutsuo HIDAKA
7th Author's Affiliation International Superconductivity Technology Center (ISTEC)
8th Author's Name Tetsuro SATOH
8th Author's Affiliation International Superconductivity Technology Center (ISTEC)
9th Author's Name Shuichi NAGASAWA
9th Author's Affiliation International Superconductivity Technology Center (ISTEC)
10th Author's Name Kenji HINODE
10th Author's Affiliation International Superconductivity Technology Center (ISTEC)
Date 2011-01-24
Paper # SCE2010-41
Volume (vol) vol.110
Number (no) 385
Page pp.pp.-
#Pages 6
Date of Issue