Presentation 2011-01-24
Development of ultra-low field MRI system using HTS-rf-SQUID
Shohei FUKUMOTO, Yukihiro KATSU, Miho SUZUKI, Ryosuke MORITA, Yusuke NAGANUMA, Yoshimi HATSUKADE, Saburo TANAKA,
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Abstract(in English) In this study, we constructed a ultra-low field (ULF) NMR/MRI system employing a high-temperature superconductor (HTS)-rf-SQUID magnetometer and room-temperature coils. In the system, we employed a pulsed polarizing field B_p of approximately 30 mT perpendicular to a measurement field B_m of approximately 45 μT. We measured the ^1H-NMR signals for water and mineral oil and found a clear difference in their signal amplitudes. The longitudinal relaxation times T_1 of water and the oil were also estimated by changing the polarizing time of B_p. By applying a field gradient dB_z/dz of approximately 10 nT/cm to a sample, which was designed to contain water in two compartments, a ^1H-NMR spectrum with two peaks was observed. The frequency difference between the two peaks roughly corresponded to the distance between each center of the water in the two parts. From these results, it was suggested that ^1H and T_1-weighted contrast imaging will be realized by this system.
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Keyword(in English) HTS-rf-SQUID / MRI / NMR / Ultra-low field
Paper # SCE2010-38
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Conference Information
Committee SCE
Conference Date 2011/1/17(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of ultra-low field MRI system using HTS-rf-SQUID
Sub Title (in English)
Keyword(1) HTS-rf-SQUID
Keyword(2) MRI
Keyword(3) NMR
Keyword(4) Ultra-low field
1st Author's Name Shohei FUKUMOTO
1st Author's Affiliation Toyohashi University of Technology()
2nd Author's Name Yukihiro KATSU
2nd Author's Affiliation Toyohashi University of Technology
3rd Author's Name Miho SUZUKI
3rd Author's Affiliation Toyohashi University of Technology
4th Author's Name Ryosuke MORITA
4th Author's Affiliation Toyohashi University of Technology
5th Author's Name Yusuke NAGANUMA
5th Author's Affiliation Toyohashi University of Technology
6th Author's Name Yoshimi HATSUKADE
6th Author's Affiliation Toyohashi University of Technology
7th Author's Name Saburo TANAKA
7th Author's Affiliation Toyohashi University of Technology
Date 2011-01-24
Paper # SCE2010-38
Volume (vol) vol.110
Number (no) 385
Page pp.pp.-
#Pages 4
Date of Issue