Presentation 2010-11-26
A method for evaluating examination papers by chunking and slicing in assembly programming exercise
Yuichiro TATEIWA, Hirokazu YOSHIDA, Daisuke YAMAMOTO, Naohisa TAKAHASHI,
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Abstract(in English) We had developed a mechanism for automatically detecting program bugs of examination papers in assembly programming exercise. The mechanism verifies student program against correct answer program in behavior of programs, usage of machine resources in programs, and control structure of programs. However, we have noticed that it is hard for students to find out error statements which cause the bugs by analyzing the verification logs. Our purpose is to generate expression for assisting students to find out error statements. Consequently we propose methods for detecting bugs by chunk and narrowing scope of machine resource usage bugs by chunk and program slice. Since the method refines the scope more strongly than conventional one, the method is useful for development of more helpful debuggers and a function for providing more helpful hints in exercise.
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Keyword(in English) e-learning / automatic evaluation / dynamic backward slice / program slice / assembly programing
Paper # ET2010-58
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Conference Date 2010/11/19(1days)
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Registration To Educational Technology (ET)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A method for evaluating examination papers by chunking and slicing in assembly programming exercise
Sub Title (in English)
Keyword(1) e-learning
Keyword(2) automatic evaluation
Keyword(3) dynamic backward slice
Keyword(4) program slice
Keyword(5) assembly programing
1st Author's Name Yuichiro TATEIWA
1st Author's Affiliation Nagoya Institute of Technology()
2nd Author's Name Hirokazu YOSHIDA
2nd Author's Affiliation Panasonic Advanced Technology Development Co., Ltd.
3rd Author's Name Daisuke YAMAMOTO
3rd Author's Affiliation Nagoya Institute of Technology
4th Author's Name Naohisa TAKAHASHI
4th Author's Affiliation Nagoya Institute of Technology
Date 2010-11-26
Paper # ET2010-58
Volume (vol) vol.110
Number (no) 312
Page pp.pp.-
#Pages 6
Date of Issue