Presentation | 2010-11-26 A method for evaluating examination papers by chunking and slicing in assembly programming exercise Yuichiro TATEIWA, Hirokazu YOSHIDA, Daisuke YAMAMOTO, Naohisa TAKAHASHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We had developed a mechanism for automatically detecting program bugs of examination papers in assembly programming exercise. The mechanism verifies student program against correct answer program in behavior of programs, usage of machine resources in programs, and control structure of programs. However, we have noticed that it is hard for students to find out error statements which cause the bugs by analyzing the verification logs. Our purpose is to generate expression for assisting students to find out error statements. Consequently we propose methods for detecting bugs by chunk and narrowing scope of machine resource usage bugs by chunk and program slice. Since the method refines the scope more strongly than conventional one, the method is useful for development of more helpful debuggers and a function for providing more helpful hints in exercise. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | e-learning / automatic evaluation / dynamic backward slice / program slice / assembly programing |
Paper # | ET2010-58 |
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Committee | ET |
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Conference Date | 2010/11/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Educational Technology (ET) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A method for evaluating examination papers by chunking and slicing in assembly programming exercise |
Sub Title (in English) | |
Keyword(1) | e-learning |
Keyword(2) | automatic evaluation |
Keyword(3) | dynamic backward slice |
Keyword(4) | program slice |
Keyword(5) | assembly programing |
1st Author's Name | Yuichiro TATEIWA |
1st Author's Affiliation | Nagoya Institute of Technology() |
2nd Author's Name | Hirokazu YOSHIDA |
2nd Author's Affiliation | Panasonic Advanced Technology Development Co., Ltd. |
3rd Author's Name | Daisuke YAMAMOTO |
3rd Author's Affiliation | Nagoya Institute of Technology |
4th Author's Name | Naohisa TAKAHASHI |
4th Author's Affiliation | Nagoya Institute of Technology |
Date | 2010-11-26 |
Paper # | ET2010-58 |
Volume (vol) | vol.110 |
Number (no) | 312 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |