Presentation 2010-11-11
Observations of Structural Transition of Tin Plated Fretting Contacts using FIB-SEM
Tetsuya ITO, Shigeru OGIHARA, Yasuhiro HATTORI,
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Abstract(in English) In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and so on. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In this report, three-dimensional observations using Focused Ion Beam (FIB) - SEM method have been made for tin plated fretting contacts before, during and after the contact resistance increase with tin plating thickness 5 urn. With these observations, the three dimensional structural transition from tin to tin oxide have been examined.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Fretting / FIB-SEM
Paper # EMD2010-82
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Committee EMD
Conference Date 2010/11/4(1days)
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Registration To Electromechanical Devices (EMD)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Observations of Structural Transition of Tin Plated Fretting Contacts using FIB-SEM
Sub Title (in English)
Keyword(1) Fretting
Keyword(2) FIB-SEM
1st Author's Name Tetsuya ITO
1st Author's Affiliation AutoNetworks Technologies, Ltd.()
2nd Author's Name Shigeru OGIHARA
2nd Author's Affiliation AutoNetworks Technologies, Ltd.
3rd Author's Name Yasuhiro HATTORI
3rd Author's Affiliation AutoNetworks Technologies, Ltd.
Date 2010-11-11
Paper # EMD2010-82
Volume (vol) vol.110
Number (no) 270
Page pp.pp.-
#Pages 4
Date of Issue