Presentation 2010-11-29
A Consideration of Substrate Noise Sensitivity of Analog Elements
Satoshi TAKAYA, Yoji BANDO, Takashi HASEGAWA, Toru OHKAWA, Masaaki SOUDA, Toshiharu TAKARAMOTO, Toshio YAMADA, Shigetaka KUMASHIRO, Tohru MOGAMI, Makoto NAGATA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometory and operating conditions. Substrate sensitivity has a relation with the signal gain, and the output resistance value of the tail current source.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) mixedsignal VLSI / substrate crosstalk / on-chip monitor
Paper # CPM2010-126,ICD2010-85
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Conference Information
Committee CPM
Conference Date 2010/11/22(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Consideration of Substrate Noise Sensitivity of Analog Elements
Sub Title (in English)
Keyword(1) mixedsignal VLSI
Keyword(2) substrate crosstalk
Keyword(3) on-chip monitor
1st Author's Name Satoshi TAKAYA
1st Author's Affiliation Graduate School of System Informatics, Kobe University()
2nd Author's Name Yoji BANDO
2nd Author's Affiliation Graduate School of System Informatics, Kobe University
3rd Author's Name Takashi HASEGAWA
3rd Author's Affiliation Graduate School of System Informatics, Kobe University
4th Author's Name Toru OHKAWA
4th Author's Affiliation MIRAI-Selete
5th Author's Name Masaaki SOUDA
5th Author's Affiliation MIRAI-Selete
6th Author's Name Toshiharu TAKARAMOTO
6th Author's Affiliation MIRAI-Selete
7th Author's Name Toshio YAMADA
7th Author's Affiliation MIRAI-Selete
8th Author's Name Shigetaka KUMASHIRO
8th Author's Affiliation MIRAI-Selete
9th Author's Name Tohru MOGAMI
9th Author's Affiliation MIRAI-Selete
10th Author's Name Makoto NAGATA
10th Author's Affiliation Graduate School of System Informatics, Kobe University
Date 2010-11-29
Paper # CPM2010-126,ICD2010-85
Volume (vol) vol.110
Number (no) 314
Page pp.pp.-
#Pages 5
Date of Issue