Presentation 2010-11-29
Evaluation of on-chip power noise generation and injection in SRAM core
Takuya SAWADA, Taku TOSHIKAWA, Tsubasa MASUI, Makoto NAGATA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) The noise tolerance of SRAM was evaluated by evaluating the power supply noise generation, and injecting the RF noise into the power supply in the test chip that was able to evaluate SRAM memory. It was ascertained that the failure bit incidence tends to increase depending on the amount of the noise power as a result of evaluation of injecting the RF noise. In addition, the possibility that the average voltage was dominant in the failure bit incidence was obtained. The necessity for considering a dynamic power supply variation for the failure bit analysis was shown from these results.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SRAM memory / bit failure / noise injection / power supply noise
Paper # CPM2010-125,ICD2010-84
Date of Issue

Conference Information
Committee CPM
Conference Date 2010/11/22(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of on-chip power noise generation and injection in SRAM core
Sub Title (in English)
Keyword(1) SRAM memory
Keyword(2) bit failure
Keyword(3) noise injection
Keyword(4) power supply noise
1st Author's Name Takuya SAWADA
1st Author's Affiliation Graduate School of System Informatics, Kobe University()
2nd Author's Name Taku TOSHIKAWA
2nd Author's Affiliation Graduate School of System Informatics, Kobe University
3rd Author's Name Tsubasa MASUI
3rd Author's Affiliation Graduate School of System Informatics, Kobe University
4th Author's Name Makoto NAGATA
4th Author's Affiliation Graduate School of System Informatics, Kobe University:JST,CREST
Date 2010-11-29
Paper # CPM2010-125,ICD2010-84
Volume (vol) vol.110
Number (no) 314
Page pp.pp.-
#Pages 6
Date of Issue