Presentation | 2010/11/23 A Study on the success rate of MIA under various probability density function estimations Yohei HORI, Takahiro YOSHIDA, Toshihiro KATASHITA, Akashi SATOH, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The probability density function (PDF) of the voltage of AES hardware module is estimated in various ways and applied to Mutual Information Analysis Attacks (MIA). The efficiency of MIA attacks using different PDFs are compared in terms of the number of wave traces required to reveal the entire secret key. We used histogram method and kernel density estimation as nonparametric estimation methods, and maximum likelihood estimation as a parametric method. Our experimental results show that MIA with the maximum likelihood estimation is the best attack method, while MIA with the histogram method requires the most number of wave traces. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Side-channel attack / Mutual Information Analysis(MIA) / Advanced Encryption Standard(AES) / probability density function / Field-Programmable Gate Array(FPGA) |
Paper # | RECONF-2010-48 |
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Conference Information | |
Committee | RECONF |
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Conference Date | 2010/11/23(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Reconfigurable Systems (RECONF) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study on the success rate of MIA under various probability density function estimations |
Sub Title (in English) | |
Keyword(1) | Side-channel attack |
Keyword(2) | Mutual Information Analysis(MIA) |
Keyword(3) | Advanced Encryption Standard(AES) |
Keyword(4) | probability density function |
Keyword(5) | Field-Programmable Gate Array(FPGA) |
1st Author's Name | Yohei HORI |
1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST)() |
2nd Author's Name | Takahiro YOSHIDA |
2nd Author's Affiliation | College of Science and Engineering, Aoyama Gakuin University |
3rd Author's Name | Toshihiro KATASHITA |
3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
4th Author's Name | Akashi SATOH |
4th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
Date | 2010/11/23 |
Paper # | RECONF-2010-48 |
Volume (vol) | vol.110 |
Number (no) | 319 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |