Presentation 2010/11/23
A Study on the success rate of MIA under various probability density function estimations
Yohei HORI, Takahiro YOSHIDA, Toshihiro KATASHITA, Akashi SATOH,
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Abstract(in English) The probability density function (PDF) of the voltage of AES hardware module is estimated in various ways and applied to Mutual Information Analysis Attacks (MIA). The efficiency of MIA attacks using different PDFs are compared in terms of the number of wave traces required to reveal the entire secret key. We used histogram method and kernel density estimation as nonparametric estimation methods, and maximum likelihood estimation as a parametric method. Our experimental results show that MIA with the maximum likelihood estimation is the best attack method, while MIA with the histogram method requires the most number of wave traces.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Side-channel attack / Mutual Information Analysis(MIA) / Advanced Encryption Standard(AES) / probability density function / Field-Programmable Gate Array(FPGA)
Paper # RECONF-2010-48
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Committee RECONF
Conference Date 2010/11/23(1days)
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Registration To Reconfigurable Systems (RECONF)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on the success rate of MIA under various probability density function estimations
Sub Title (in English)
Keyword(1) Side-channel attack
Keyword(2) Mutual Information Analysis(MIA)
Keyword(3) Advanced Encryption Standard(AES)
Keyword(4) probability density function
Keyword(5) Field-Programmable Gate Array(FPGA)
1st Author's Name Yohei HORI
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)()
2nd Author's Name Takahiro YOSHIDA
2nd Author's Affiliation College of Science and Engineering, Aoyama Gakuin University
3rd Author's Name Toshihiro KATASHITA
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
4th Author's Name Akashi SATOH
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology(AIST)
Date 2010/11/23
Paper # RECONF-2010-48
Volume (vol) vol.110
Number (no) 319
Page pp.pp.-
#Pages 6
Date of Issue