Presentation | 2010/11/23 Magnetic Field Measurement for Side-channel Analysis Environment Toshihiro KATASHITA, Yohei HORI, Akashi SATOH, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Cryptography used widely in electronic products is evaluated in terms of computationally-secure, however there is vulnerability of hardware modules to physical attacks. Side-channel attacks are one of noninvasive physical attacks, and are considered serious threats to cryptographic modules. Side-channel Attack Standard Evaluation Board (SASEBO) that is developed as a standard evaluation environment has measurement capability for power analysis. In this paper, we took experimentation in order to evaluate potential of SASEBO for near electromagnetic field measurement. EM signals of an AES circuit were measured and analyzed with CPA. Difference of magnetic field strength between locations of cryptographic circuit was also observed. As the result, we could explore the secret key of the AES circuit, and difference of magnetic field could be determined between locations that AES circuits were implemented on. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | FPGA / Cryptography / Side-channel attack / Standard evaluation environment |
Paper # | RECONF-2010-46 |
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Committee | RECONF |
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Conference Date | 2010/11/23(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Reconfigurable Systems (RECONF) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Magnetic Field Measurement for Side-channel Analysis Environment |
Sub Title (in English) | |
Keyword(1) | FPGA |
Keyword(2) | Cryptography |
Keyword(3) | Side-channel attack |
Keyword(4) | Standard evaluation environment |
1st Author's Name | Toshihiro KATASHITA |
1st Author's Affiliation | Research Center for Information Security, National Institute of Advanced Industrial Science and Technology() |
2nd Author's Name | Yohei HORI |
2nd Author's Affiliation | Research Center for Information Security, National Institute of Advanced Industrial Science and Technology |
3rd Author's Name | Akashi SATOH |
3rd Author's Affiliation | Research Center for Information Security, National Institute of Advanced Industrial Science and Technology |
Date | 2010/11/23 |
Paper # | RECONF-2010-46 |
Volume (vol) | vol.110 |
Number (no) | 319 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |