Presentation 2010/11/23
Magnetic Field Measurement for Side-channel Analysis Environment
Toshihiro KATASHITA, Yohei HORI, Akashi SATOH,
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Abstract(in English) Cryptography used widely in electronic products is evaluated in terms of computationally-secure, however there is vulnerability of hardware modules to physical attacks. Side-channel attacks are one of noninvasive physical attacks, and are considered serious threats to cryptographic modules. Side-channel Attack Standard Evaluation Board (SASEBO) that is developed as a standard evaluation environment has measurement capability for power analysis. In this paper, we took experimentation in order to evaluate potential of SASEBO for near electromagnetic field measurement. EM signals of an AES circuit were measured and analyzed with CPA. Difference of magnetic field strength between locations of cryptographic circuit was also observed. As the result, we could explore the secret key of the AES circuit, and difference of magnetic field could be determined between locations that AES circuits were implemented on.
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Keyword(in English) FPGA / Cryptography / Side-channel attack / Standard evaluation environment
Paper # RECONF-2010-46
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Conference Information
Committee RECONF
Conference Date 2010/11/23(1days)
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Registration To Reconfigurable Systems (RECONF)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Magnetic Field Measurement for Side-channel Analysis Environment
Sub Title (in English)
Keyword(1) FPGA
Keyword(2) Cryptography
Keyword(3) Side-channel attack
Keyword(4) Standard evaluation environment
1st Author's Name Toshihiro KATASHITA
1st Author's Affiliation Research Center for Information Security, National Institute of Advanced Industrial Science and Technology()
2nd Author's Name Yohei HORI
2nd Author's Affiliation Research Center for Information Security, National Institute of Advanced Industrial Science and Technology
3rd Author's Name Akashi SATOH
3rd Author's Affiliation Research Center for Information Security, National Institute of Advanced Industrial Science and Technology
Date 2010/11/23
Paper # RECONF-2010-46
Volume (vol) vol.110
Number (no) 319
Page pp.pp.-
#Pages 6
Date of Issue