Presentation | 2010-12-01 A Sequential Test Generation Method and a Binding Method for Testability Using Behavioral Description Ryoichi INOUE, Hiroaki FUJIWARA, Toshinori HOSOKAWA, Hideo FUJIWARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Although many works on test generation algorithms for sequential circuits have been reported so far, it is still very hard to achieve high fault coverage because of the complexity of sequential test generation. Several test generation methods using behavioral description and functional register transfer level (RTL) circuits at high level have been proposed to accelerate test generation time. Among them, there are works on test generation methods for assignment decision diagrams (ADDs) that represent functional RTL circuits. However, the test sequence generated by those methods without considering resource binding cannot guarantee to achieve high fault coverage at gate level even if the test environment coverage at RTL is high. This paper proposes a test generation method that considers resource binding in order to achieve higher fault coverage than previous methods. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Sequential test generation / behavioral synthesis / binding / test environment / assignment decision diagrams |
Paper # | VLD2010-76,DC2010-43 |
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Conference Information | |
Committee | DC |
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Conference Date | 2010/11/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Sequential Test Generation Method and a Binding Method for Testability Using Behavioral Description |
Sub Title (in English) | |
Keyword(1) | Sequential test generation |
Keyword(2) | behavioral synthesis |
Keyword(3) | binding |
Keyword(4) | test environment |
Keyword(5) | assignment decision diagrams |
1st Author's Name | Ryoichi INOUE |
1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
2nd Author's Name | Hiroaki FUJIWARA |
2nd Author's Affiliation | Graduate School of Industrial Technology, Nihon University |
3rd Author's Name | Toshinori HOSOKAWA |
3rd Author's Affiliation | College of Industrial Technology, Nihon University |
4th Author's Name | Hideo FUJIWARA |
4th Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology (NAIST) |
Date | 2010-12-01 |
Paper # | VLD2010-76,DC2010-43 |
Volume (vol) | vol.110 |
Number (no) | 317 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |