Presentation 2010-12-01
Evaluation and Verification of Dependable Processor Architecture Using System-Level Fault-Injection Scheme
Yohei NAKATA, Yasuhiro ITO, Yasuo SUGURE, Shigeru OHO, Hiroko KAWAGUCHI, Masahiko YOSHIMOTO,
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Abstract(in English) We develop a fault case generator that can generate memory failures in aprocessor-in-the-loop simulation. The fault injection system (FIS) generates memory failure patterns based on a transistor-level simulation and SRAM failure model. By using this FIS, processors with 6T normal SRAM and with 7T/14T dependable SRAM can be evaluated and compared. We confirmed that the dependable SRAM reduces abnormal terminations and improves a system-level dependability in a vehicle engine control system.
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Keyword(in English) Fault-Injection / SRAM / Dependable Processor / System-Level Verification
Paper # VLD2010-74,DC2010-41
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Committee DC
Conference Date 2010/11/22(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation and Verification of Dependable Processor Architecture Using System-Level Fault-Injection Scheme
Sub Title (in English)
Keyword(1) Fault-Injection
Keyword(2) SRAM
Keyword(3) Dependable Processor
Keyword(4) System-Level Verification
1st Author's Name Yohei NAKATA
1st Author's Affiliation Graduate School of System Informatics, Kobe University()
2nd Author's Name Yasuhiro ITO
2nd Author's Affiliation Hitachi, Ltd. Central Research Laboratory
3rd Author's Name Yasuo SUGURE
3rd Author's Affiliation Hitachi, Ltd. Central Research Laboratory
4th Author's Name Shigeru OHO
4th Author's Affiliation Hitachi, Ltd. Central Research Laboratory
5th Author's Name Hiroko KAWAGUCHI
5th Author's Affiliation Graduate School of System Informatics, Kobe University
6th Author's Name Masahiko YOSHIMOTO
6th Author's Affiliation Graduate School of System Informatics, Kobe University:Japan Science and Technology Agencey, CREST
Date 2010-12-01
Paper # VLD2010-74,DC2010-41
Volume (vol) vol.110
Number (no) 317
Page pp.pp.-
#Pages 6
Date of Issue