Presentation 2010-12-01
SREEP : A Tool for Secure Scan Design Using Shift Register Equivalents
Katsuya FUJIWARA, Hideo FUJIWARA, Hideo TAMAMOTO,
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Abstract(in English) It is important to find an efficient design-for-testability methodology that satisfies both security and testability though there exists an inherent contradiction between security and testability for digital circuits. The authors reported a secure and testable scan design approach by using extended shift registers that are functionally equivalent but not structurally equivalent to shift registers, and clarified each cardinality of several classes of shift register equivalents (SR-equivalents) as well as the whole class of SR-equivalents. In this paper, we present a tool for secure scan design that generates secure scan circuits based on the proposed SR-equivalent method, shows their security level, and provides data necessary for scan-in/out operation during test generation.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Design for Terstability / Secure Scan / Shift Register Equivalent / Equivalent Class
Paper # VLD2010-72,DC2010-39
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Committee DC
Conference Date 2010/11/22(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) SREEP : A Tool for Secure Scan Design Using Shift Register Equivalents
Sub Title (in English)
Keyword(1) Design for Terstability
Keyword(2) Secure Scan
Keyword(3) Shift Register Equivalent
Keyword(4) Equivalent Class
1st Author's Name Katsuya FUJIWARA
1st Author's Affiliation Department of Computer Science and Engineering, Akita University()
2nd Author's Name Hideo FUJIWARA
2nd Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology
3rd Author's Name Hideo TAMAMOTO
3rd Author's Affiliation Department of Computer Science and Engineering, Akita University
Date 2010-12-01
Paper # VLD2010-72,DC2010-39
Volume (vol) vol.110
Number (no) 317
Page pp.pp.-
#Pages 6
Date of Issue