Presentation 2010-11-29
Experimental Evaluation of Built-in Test Pattern Generation with Image
Yuka IWAMOTO, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) Built-in Self Test (BIST) is one of effective methods for testing today's verylarge-scale SoCs. In BIST scheme, a test pattern generator (TPG), which generates test vector sequences fed to cores-under-test, must be embedded into SoCs. In this paper, we target the testing of SoCs with multimedia cores and introduce a scheme to utilize an image decoder, e.g., JPEG decoder, included in the multimedia cores as an embedded TPG. This scheme does not require additional embedded TPGs, so that it can reduce the hardware overhead of BIST methods. Moreover, we propose a method for generating seeds (or initial values of TPGs) in the case where a JPEG decoder is utilized as a TPG. The proposed seed generation algorithm can generate effective seeds, which are small in data size and can be decompressed to test sequences with high fault coverage. Experimental results show that, compared with a previous BIST method, the proposed method can achieve comparable fault coverage with smaller seeds and shorter decompressed test sequences.
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Keyword(in English) Built-in self-test / multimedia cores / image decoder / and JPEG
Paper # VLD2010-63,DC2010-30
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Committee DC
Conference Date 2010/11/22(1days)
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Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Experimental Evaluation of Built-in Test Pattern Generation with Image
Sub Title (in English)
Keyword(1) Built-in self-test
Keyword(2) multimedia cores
Keyword(3) image decoder
Keyword(4) and JPEG
1st Author's Name Yuka IWAMOTO
1st Author's Affiliation Graduate School of Information Science, Hiroshima City University()
2nd Author's Name Yuki YOSHIKAWA
2nd Author's Affiliation Graduate School of Information Science, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Graduate School of Information Science, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Graduate School of Information Science, Hiroshima City University
Date 2010-11-29
Paper # VLD2010-63,DC2010-30
Volume (vol) vol.110
Number (no) 317
Page pp.pp.-
#Pages 6
Date of Issue