| Presentation | 2010-11-29 A decision method of target detected pseudo primary outputs on Low-capture-swithing-activity test generation Yang SHEN, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | High launch switching activity in capture mode during at-speed scan testing may lead to excessive IR-drop. Excessive IR-drop causes test-induced yield loss. A test pattern set is classified to a capture-safe pattern set and a capture-unsafe pattern set. If the launch switching activity exceeds the value of threshold, the test patterns are referred to capture-safe patterns. Other patterns are referred to capture-unsafe patterns. Faults detected by only capture-unsafe patterns are defined as unsafe faults. Other faults are defined as safe faults. It is important to generate capture-safe patterns for unsafe faults to avoid test-induced yield loss due to excessive IR-drop. In this paper, test patterns to unsafe faults for analysis are generated and the launch switching activity is analyzed. The information for a pair of a safe faults and its detected pseudo primary output is used for the analysis. Experimental results for ITC'99 benchmark circuits show that 90% of the test patterns for the analysis are capture-safe when a pseudo primary output where safe faults are detected by capture-safe patterns is the same as the pseudo primary output where safe faults are detected by test patterns for the analysis. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | capture power reduction / detected pseudo primary outputs / capture-safe / broad side testing |
| Paper # | VLD2010-62,DC2010-29 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2010/11/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A decision method of target detected pseudo primary outputs on Low-capture-swithing-activity test generation |
| Sub Title (in English) | |
| Keyword(1) | capture power reduction |
| Keyword(2) | detected pseudo primary outputs |
| Keyword(3) | capture-safe |
| Keyword(4) | broad side testing |
| 1st Author's Name | Yang SHEN |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Faculty of Engineering, Kyushu University |
| Date | 2010-11-29 |
| Paper # | VLD2010-62,DC2010-29 |
| Volume (vol) | vol.110 |
| Number (no) | 317 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |