| Presentation | 2010-11-29 Evaluation of Multi-Cycle Test with Partial Observation in Scan-Based BIST Structure Hisato YAmAGUCHI, Makoto MATSUZONO, Yasuo SATO, Seiji KAJIHARA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for the purpose of reducing test data and improving its fault coverage in scan-based BIST structure, we propose a multi-cycle test method which observes the value of partial flip-flops during capture operations. We evaluate the effect of fault coverage improvement and its dependency on choosing methods of observable flip-flops and a ratio of observed flip-flops. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / multi-cycle test / multiple observation / scan test |
| Paper # | VLD2010-61,DC2010-28 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2010/11/22(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Multi-Cycle Test with Partial Observation in Scan-Based BIST Structure |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | multi-cycle test |
| Keyword(3) | multiple observation |
| Keyword(4) | scan test |
| 1st Author's Name | Hisato YAmAGUCHI |
| 1st Author's Affiliation | Department of Computer Science and Electronics:JST CREST() |
| 2nd Author's Name | Makoto MATSUZONO |
| 2nd Author's Affiliation | Department of Computer Science and Electronics:JST CREST |
| 3rd Author's Name | Yasuo SATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 4th Author's Name | Seiji KAJIHARA |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| Date | 2010-11-29 |
| Paper # | VLD2010-61,DC2010-28 |
| Volume (vol) | vol.110 |
| Number (no) | 317 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |