Presentation 2010-11-29
Evaluation of Multi-Cycle Test with Partial Observation in Scan-Based BIST Structure
Hisato YAmAGUCHI, Makoto MATSUZONO, Yasuo SATO, Seiji KAJIHARA,
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Abstract(in English) Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for the purpose of reducing test data and improving its fault coverage in scan-based BIST structure, we propose a multi-cycle test method which observes the value of partial flip-flops during capture operations. We evaluate the effect of fault coverage improvement and its dependency on choosing methods of observable flip-flops and a ratio of observed flip-flops.
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Keyword(in English) BIST / multi-cycle test / multiple observation / scan test
Paper # VLD2010-61,DC2010-28
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Committee DC
Conference Date 2010/11/22(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of Multi-Cycle Test with Partial Observation in Scan-Based BIST Structure
Sub Title (in English)
Keyword(1) BIST
Keyword(2) multi-cycle test
Keyword(3) multiple observation
Keyword(4) scan test
1st Author's Name Hisato YAmAGUCHI
1st Author's Affiliation Department of Computer Science and Electronics:JST CREST()
2nd Author's Name Makoto MATSUZONO
2nd Author's Affiliation Department of Computer Science and Electronics:JST CREST
3rd Author's Name Yasuo SATO
3rd Author's Affiliation Kyushu Institute of Technology:JST CREST
4th Author's Name Seiji KAJIHARA
4th Author's Affiliation Kyushu Institute of Technology:JST CREST
Date 2010-11-29
Paper # VLD2010-61,DC2010-28
Volume (vol) vol.110
Number (no) 317
Page pp.pp.-
#Pages 6
Date of Issue