Presentation | 2010-11-29 Evaluation of Multi-Cycle Test with Partial Observation in Scan-Based BIST Structure Hisato YAmAGUCHI, Makoto MATSUZONO, Yasuo SATO, Seiji KAJIHARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Reducing test data volume is important for field BIST because the data should be stored on a chip. In this paper, for the purpose of reducing test data and improving its fault coverage in scan-based BIST structure, we propose a multi-cycle test method which observes the value of partial flip-flops during capture operations. We evaluate the effect of fault coverage improvement and its dependency on choosing methods of observable flip-flops and a ratio of observed flip-flops. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | BIST / multi-cycle test / multiple observation / scan test |
Paper # | VLD2010-61,DC2010-28 |
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Committee | DC |
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Conference Date | 2010/11/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of Multi-Cycle Test with Partial Observation in Scan-Based BIST Structure |
Sub Title (in English) | |
Keyword(1) | BIST |
Keyword(2) | multi-cycle test |
Keyword(3) | multiple observation |
Keyword(4) | scan test |
1st Author's Name | Hisato YAmAGUCHI |
1st Author's Affiliation | Department of Computer Science and Electronics:JST CREST() |
2nd Author's Name | Makoto MATSUZONO |
2nd Author's Affiliation | Department of Computer Science and Electronics:JST CREST |
3rd Author's Name | Yasuo SATO |
3rd Author's Affiliation | Kyushu Institute of Technology:JST CREST |
4th Author's Name | Seiji KAJIHARA |
4th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
Date | 2010-11-29 |
Paper # | VLD2010-61,DC2010-28 |
Volume (vol) | vol.110 |
Number (no) | 317 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |