| Presentation | 2010-10-22 Singularity Compensation at Conductor Edges for the Finite-Difference Approximation : Edges of Thin Metal Plates Tsugumichi SHIBATA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The line of force concentrates on the edge and the corner of the metal, and the electromagnetic field strength shows a steep change spatially in the neighborhood. Therefore, the error in the finite-difference approximation can increase locally, and it becomes a factor to deteriorate the entire analytical accuracy. The compensation for the difference equation that takes the characteristic of the field near the singularity into account has been studied since before in order to decrease the error of the finite-difference approximation. Particularly, the edge and the corner of a thin metal plate have been examined in detail, and the near-field characteristic is applicable for the compensation. This paper demonstrates the compensation for the field singularity at edges and corners of metal plates in the finite-difference field analysis of microstrip circuits, and the effect is numerically confirmed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Finite-difference / Electromagnetic field / Singularity / Edge |
| Paper # | EMCJ2010-63,MW2010-98 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2010/10/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Singularity Compensation at Conductor Edges for the Finite-Difference Approximation : Edges of Thin Metal Plates |
| Sub Title (in English) | |
| Keyword(1) | Finite-difference |
| Keyword(2) | Electromagnetic field |
| Keyword(3) | Singularity |
| Keyword(4) | Edge |
| 1st Author's Name | Tsugumichi SHIBATA |
| 1st Author's Affiliation | NTT Microsystem Integration Laboratories, NTT Corporation() |
| Date | 2010-10-22 |
| Paper # | EMCJ2010-63,MW2010-98 |
| Volume (vol) | vol.110 |
| Number (no) | 236 |
| Page | pp.pp.- |
| #Pages | 6 |
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