Presentation | 2010-10-25 Field Emission Properties of Nitrogen-doped Diamond Related with C-N Bond Yuki KUDO, Tomoaki MASUZAWA, Yusuke SATO, Ichitaro SAITO, Takatoshi YAMADA, Angel T. T. KOH, Daniel H. C. CHUA, Teruo YOSHINO, Wang J. CHUN, Satoshi YAMASAKI, Ken OKANO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Electron field emission measurement and Time-of-flight secondary ion mass spectroscopy (TOF-SIMS) were carried out on nitrogen (N-) doped diamond films of two different impurity sources; urea and dimethylurea. Urea doped diamond films exhibited the strongest signal intensity of C-N bonds according to the TOF-SIMS results. As for the field emission properties, the enhancement factor β was characterised not only by Fowler-Nordheim (F-N) plot, but also by V-d plot where the voltage required for a certain value of emission current to flow was plotted against each anode-cathode distance. The largest β was acquired from the diamond film with the most C-N counts, and therefore more C-N maybe the key to enhancing electron field emission from N-doped diamond. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | nitrogen-doped diamond / dimethylurea / urea / field emission / enhancement factor β / TOF-SIMS |
Paper # | ED2010-130 |
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Conference Information | |
Committee | ED |
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Conference Date | 2010/10/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Field Emission Properties of Nitrogen-doped Diamond Related with C-N Bond |
Sub Title (in English) | |
Keyword(1) | nitrogen-doped diamond |
Keyword(2) | dimethylurea |
Keyword(3) | urea |
Keyword(4) | field emission |
Keyword(5) | enhancement factor β |
Keyword(6) | TOF-SIMS |
1st Author's Name | Yuki KUDO |
1st Author's Affiliation | Graduate School of Pure and Applied Sciences, University of Tsukuba:Department of Materials Science, International Christian University() |
2nd Author's Name | Tomoaki MASUZAWA |
2nd Author's Affiliation | Department of Materials Science, International Christian University |
3rd Author's Name | Yusuke SATO |
3rd Author's Affiliation | Department of Materials Science, International Christian University |
4th Author's Name | Ichitaro SAITO |
4th Author's Affiliation | Department of Materials Science, International Christian University:Department of Engineering, University of Cambridge |
5th Author's Name | Takatoshi YAMADA |
5th Author's Affiliation | Nanotube Research Center, National Institute of Advanced Industrial Science and Technology |
6th Author's Name | Angel T. T. KOH |
6th Author's Affiliation | Department of Materials Science and Engineering, National University of Singapore |
7th Author's Name | Daniel H. C. CHUA |
7th Author's Affiliation | Department of Materials Science and Engineering, National University of Singapore |
8th Author's Name | Teruo YOSHINO |
8th Author's Affiliation | Department of Materials Science, International Christian University |
9th Author's Name | Wang J. CHUN |
9th Author's Affiliation | Department of Materials Science, International Christian University |
10th Author's Name | Satoshi YAMASAKI |
10th Author's Affiliation | Graduate School of Pure and Applied Sciences, University of Tsukuba:Energy Technology Research Institute, National Institute of Advanced Industrial Science and Technology |
11th Author's Name | Ken OKANO |
11th Author's Affiliation | Department of Materials Science, International Christian University |
Date | 2010-10-25 |
Paper # | ED2010-130 |
Volume (vol) | vol.110 |
Number (no) | 249 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |