Presentation 2010-10-19
Integration of Optical Circuits with SFQ Circuits : Examination of Optical Component Using ISTEC Nb Standard Process II
Yoshiki Arita, Nobuyuki Yoshokawa, Toshihiko Baba,
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Abstract(in English) Single-flux-quantum (SFQ) circuits and optical circuits are expected for next generation's integrated circuit. As for the former, speed-up and power saving of processors such as CPU are expected. As for the latter, similar improvements of interconnection and I/O are expected. We are aiming at opto-SFQ integrated circuits that make the best use of the advantage of these two technologies. In this study, we studied an optical waveguide and an opto-electric (O-E) converter which were the components necessary for opto-SFQ integrated circuits by using ISTEC Nb standard process II. We analyzed, fabricated, and measured metal clad waveguides that were able to be fabricated using conventional Nb processes. The O-E converter using Josephson junction integrated with optical waveguide were also analyzed, fabricated, and measured.
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Keyword(in English) SFQ circuit / optical circuit / optical waveguide / O-E converter / superconductive integrated circuit
Paper # SCE2010-32
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Committee SCE
Conference Date 2010/10/12(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Integration of Optical Circuits with SFQ Circuits : Examination of Optical Component Using ISTEC Nb Standard Process II
Sub Title (in English)
Keyword(1) SFQ circuit
Keyword(2) optical circuit
Keyword(3) optical waveguide
Keyword(4) O-E converter
Keyword(5) superconductive integrated circuit
1st Author's Name Yoshiki Arita
1st Author's Affiliation Department of Electrical and Computer Engineering, Yokohama National University()
2nd Author's Name Nobuyuki Yoshokawa
2nd Author's Affiliation Department of Electrical and Computer Engineering, Yokohama National University
3rd Author's Name Toshihiko Baba
3rd Author's Affiliation Department of Electrical and Computer Engineering, Yokohama National University
Date 2010-10-19
Paper # SCE2010-32
Volume (vol) vol.110
Number (no) 235
Page pp.pp.-
#Pages 6
Date of Issue