Presentation | 2010-10-19 Inductance Evaluation of SQUIDs with Flip-Chip Input Coils Takahiro YAMADA, Masaaki MAEZAWA, Michitaka MARUYAMA, Takehiko OE, Chiharu URANO, Nobu-hisa KANEKO, Mutsuo HIDAKA, Tetsuro SATOH, Shuichi NAGASAWA, Kenji HINODE, Satoshi KOHJIRO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We are developing integrated cryogenic current comparators (ICCCs). To obtain high accuracy, we have to optimize structures of ICCCs by repeating fabrication and testing of various ICCC structures. Moreover, because of integration of a lot of ICCC components such as winding coils, a superconductor shield, pick-up/input coils and a SQUID, a superconductor multilayer process including Josephson junctions is necessary. Due to these two reasons, development of ICCCs takes a long turn-around time. To shorten the turn-around time, we divided those ICCC components into two parts: each part is integrated on a single chip; one consists of a SQUID washer and the other consists of the remaining CCC core including an input coil. They are connected by using a flip-chip bonding technique. By this design scheme, we can concentrate on developing the CCC core, apart from the SQUID which is not necessary to be optimized, leading to a short turn-around time. In this scheme, however, the SQUID and the input coil should be carefully designed to have a sufficiently large coupling. We designed the input-coil and SQUID chips and evaluated the coupling coefficient. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Cryogenic Current Comparator / Integrated Cryogenic Current Comparator / SQUID / Input coil / Coupling coefficient / Flip-chip bonding / Superconductor / Multilayer process |
Paper # | SCE2010-30 |
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Conference Information | |
Committee | SCE |
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Conference Date | 2010/10/12(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Superconductive Electronics (SCE) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Inductance Evaluation of SQUIDs with Flip-Chip Input Coils |
Sub Title (in English) | |
Keyword(1) | Cryogenic Current Comparator |
Keyword(2) | Integrated Cryogenic Current Comparator |
Keyword(3) | SQUID |
Keyword(4) | Input coil |
Keyword(5) | Coupling coefficient |
Keyword(6) | Flip-chip bonding |
Keyword(7) | Superconductor |
Keyword(8) | Multilayer process |
1st Author's Name | Takahiro YAMADA |
1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST)() |
2nd Author's Name | Masaaki MAEZAWA |
2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
3rd Author's Name | Michitaka MARUYAMA |
3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
4th Author's Name | Takehiko OE |
4th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
5th Author's Name | Chiharu URANO |
5th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
6th Author's Name | Nobu-hisa KANEKO |
6th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
7th Author's Name | Mutsuo HIDAKA |
7th Author's Affiliation | International Superconductivity Technology Center(ISTEC) |
8th Author's Name | Tetsuro SATOH |
8th Author's Affiliation | International Superconductivity Technology Center(ISTEC) |
9th Author's Name | Shuichi NAGASAWA |
9th Author's Affiliation | International Superconductivity Technology Center(ISTEC) |
10th Author's Name | Kenji HINODE |
10th Author's Affiliation | International Superconductivity Technology Center(ISTEC) |
11th Author's Name | Satoshi KOHJIRO |
11th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
Date | 2010-10-19 |
Paper # | SCE2010-30 |
Volume (vol) | vol.110 |
Number (no) | 235 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |